TSM Sequence Analyzer Rules Descriptions

TSM includes the following general, performance, best practices, and statistics rules to use in the TestStand Sequence Analyzer in the TestStand Sequence Editor or the stand-alone sequence analyzer application. The built-in TSM rules are enabled by default. You can also create and deploy custom rules and analysis modules.

The following sections describe the built-in TSM rules, listed in order of severity.

General

Rule Severity Description
No DUT pins have been specified Error The Specify DUT Pins checkbox is enabled, but no DUT pin has been specified in the Specify DUT Pins section on the Options tab of the Step Settings pane of a Semiconductor Multi Test step.
Step specifies invalid DUT pins Error The Specify DUT Pins option on the Options tab of a Semiconductor Multi Test step or a Semiconductor Action step is enabled, but some of the included DUT pins are not in the pin map file.
Single limit missing Error A limit is missing on a Numeric Limit test in a Semiconductor Multi Test step.
PAT (Part Average Testing) settings invalid Error One or more PAT algorithm settings for the test program are invalid. Correct the settings on the PAT Algorithm Settings panel of the Test Program Editor.
Pin name is invalid Error A pin specified by the test in a Semiconductor Multi Test is not present in the pin map the test program specifies.
Test step properties are not assignable Error A step in the test program is setting the values of properties (such as TestNumber, FailBin, and so on) of a Semiconductor Multi Test step. Setting a property on a Semiconductor Multi Test step at run time does not change its behavior because the step does not access step properties after the first time it executes.
Instruments defined in pin map are missing from MAX Error Some of the instruments defined in the pin map are missing from Measurement & Automation Explorer (MAX), which can prevent the test program from running. Correct instrument names in the pin map or add the correct instruments in MAX.
Alarms settings are invalid Error The alarms settings do not match the pin configuration specified in the pin map. This can occur when the pin map is modified after the alarms settings have been configured. It can also occur if the configured alarms for this sequence file are not supported in the current system. Use the Alarms panel of the Test Program Editor to update the alarms settings.
Test number missing Warning A test in a Semiconductor Multi Test step does not specify a test number.
Pin map invalid Warning The specified pin map is invalid or the pin map has not been specified. Use the Pin Map panel of the Test Program Editor to specify the pin map file to use in the test program.
Software bin missing Warning A test in a Semiconductor Multi Test step does not specify a software bin.
Bin definitions invalid Warning The specified bin definitions is invalid or the bin definitions has not been specified. Use the Bin Definitions panel of the Test Program Editor to specify the bin definitions file to use in the test program.
Sessions created with LabVIEW steps used in .NET steps or vice-versa Warning A Semiconductor Multi Test or Semiconductor Action .NET step uses an instrument driver session that a Semiconductor Multi Test or Semiconductor Action LabVIEW step created or vice-versa.
Both limits missing Information A test in a Semiconductor Multi Test step does not specify any limits. For tests that have no limits, the Semiconductor Multi Test step only logs the data and does not pass or fail the test.

Performance

Rule Severity Description
LabVIEW Adapter in Development System mode Warning Configuring the LabVIEW Adapter to use the LabVIEW Development System can negatively affect performance. Configure the LabVIEW Adapter to use the LabVIEW Runtime if the LabVIEW Development System mode is not required.
Minimal use of system pins Warning A Semiconductor Multi Test step includes system pins. Including system pins forces the step code module to execute in a single thread and can negatively affect performance. Ignore this warning for steps that need to access system pins.
Non-reentrant code module Warning A Semiconductor Multi Test step or Semiconductor Action step calls a VI with the Reentrancy option on the Execution page of the VI Properties dialog box set to Non-reentrant execution or Preallocated clone re-entrant execution. Using these re-entrancy options can negatively affect performance because LabVIEW might clone the VI each time it executes.
Disable result recording option Information Enabling the Result Recording Option for steps that do not include defined tests can negatively affect performance. Enable result recording while you measure performance but disable it to attain optimal performance. This option is located on the Run Options panel of the Properties tab of the Step Settings pane of a step.

Best Practices

Rule Severity Description
Avoid overriding PreUUT, PreMainSequence, PostMainSequence callbacks Error If a run-time error occurs in one of these callbacks, the end-of-test (EOT) signal is not sent to the handler driver.

Statistics

Rule Severity Description
Count tests Information The total number of tests in all the analyzed files, including count per sequence, count per sequence file, and count per analysis.

Semiconductor Sequence Call Step

Rule Severity Description
Published data IDs should not be duplicated on tests in the called sequence Warning The 'Published Data Id' field on tests on Semiconductor Multi Test steps in sequences called by Semiconductor Sequence Call steps should not be duplicated. The duplicate tests will be omitted at run time.
Published data IDs should match a test in the called sequence Warning Simple IDs specified in the 'Step Name.Published Data Id' field on Semiconductor Sequence Call tests should match the 'Published Data Id' field of a test on a Semiconductor Multi Test step in the called sequence. Specify a value for the 'Step Name.Published Data Id' field that matches the 'Published Data Id' field of a test on a Semiconductor Multi Test step in the called sequence.
'Step Name.Published Data Id' should not be empty Warning The 'Step Name.Published Data Id' field on Semiconductor Sequence Call tests should not be empty. Specify a value for the 'Step Name.Published Data Id' field that matches the 'Published Data Id' field of a test on a Semiconductor Multi Test step in the called sequence.
'Step Name.Published Data Id' must match a test on the specified step in the called sequence Error Values that include step names for the 'Step Name.Published Data Id' field on Semiconductor Sequence Call tests must match the 'Published Data Id' field of a test on the specified Semiconductor Multi Test step in the called sequence. Specify a value for the 'Step Name.Published Data Id' field that matches the 'Published Data Id' field of a test on a Semiconductor Multi Test step in the called sequence.
Step Name.Published Data Id must not match multiple tests in the called sequence Error The 'Step Name.Published Data Id' field on Semiconductor Sequence Call tests must not match the 'Published Data Id' field of more than one test on Semiconductor Multi Test steps in the called sequence. Rename one of the steps in the called sequence or include the step name in the 'Step Name.Published Data Id' column to match a single test.