What Are NI PXI Source Measure Units?

PXI Source Measure Units (SMUs) combine high-precision source and measure capability with features designed to reduce test time and increase flexibility.

Unmatched Channel Density

Unmatched Channel Density

Reduce test time, increase throughput, and meet today's manufacturing requirements by reducing a full rack to a few inches of physical space with up to 408 SMU channels in a single PXI chassis.

Custom Transient Response

Digitally control the transient properties of PXI SMUs to maximize stability, reduce overshoot, and decrease test times with NI SourceAdapt, a patented technology on PXI SMUs that helps you avoid custom circuitry.

Built-In IV Sweep

Reconfigure and repurpose the same SMU across test cases with configuration-based IV sweeps in InstrumentStudio software and a path to more advanced customization in programming environments.

Hardware-Timed Sequences

Get your results faster by removing the communication latency between the host computer and SMU among each measurement of a sequence and, at each step, change various SMU parameters such as output mode, aperture time, current range, and transient response.

High-Power Pulsing

Operate beyond the basic DC power boundary of PXI SMUs by pulsing current or voltage instead of supplying a constant DC source, allowing you to test at high instantaneous power with limited or no heat sink infrastructure.

Recommendations for First-Time Users

PXI Source Measure Unit Bundle

The PXI Source Measure Unit (SMU) Bundle is a preconfigured set of one of NI’s most popular, high-quality SMUs and a Thunderbolt™-controlled chassis so that you can get started with ease.

PXI Source Measure Unit Bundle

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Technical White Paper


Maximizing DC Measurement Performance

In this guide, learn best practices for how you can improve measurement accuracy and product quality for power management ICs, RF power amplifiers, and other ICs. Dive deeper into topics like SMU theory of operation, minimizing external noise, and the effects of pulsing.

 

  • Source measure unit theory of operation
  • Measurement accuracy
  • Accuracy versus speed trade-off
  • The effects of pulsing

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