Reduce test time, increase throughput, and meet today's manufacturing requirements by reducing a full rack to a few inches of physical space with up to 408 SMU channels in a single PXI chassis.
Digitally control the transient properties of PXI SMUs to maximize stability, reduce overshoot, and decrease test times with NI SourceAdapt, a patented technology on PXI SMUs that helps you avoid custom circuitry.
Reconfigure and repurpose the same SMU across test cases with configuration-based IV sweeps in InstrumentStudio software and a path to more advanced customization in programming environments.
Get your results faster by removing the communication latency between the host computer and SMU among each measurement of a sequence and, at each step, change various SMU parameters such as output mode, aperture time, current range, and transient response.
Operate beyond the basic DC power boundary of PXI SMUs by pulsing current or voltage instead of supplying a constant DC source, allowing you to test at high instantaneous power with limited or no heat sink infrastructure.
Recommendations for First-Time Users
The PXI Source Measure Unit (SMU) Bundle is a preconfigured set of one of NI’s most popular, high-quality SMUs and a Thunderbolt™-controlled chassis so that you can get started with ease.
Reliability engineers are turning toward modular, flexible solutions based on PXI SMUs that can scale to increase reliability data while driving down the cost of test.
With an in-fab ATE based on PXI SMUs, IMEC cut costs by 75% and reduced their project cycle for wafer process flow testing from one month to just three days.
As LED chips get smaller, the number of chips per wafer increases to tens of millions. NI's PXI SMU helped FitTech solve its throughput challenge.
Technical White Paper
Maximizing DC Measurement Performance
In this guide, learn best practices for how you can improve measurement accuracy and product quality for power management ICs, RF power amplifiers, and other ICs. Dive deeper into topics like SMU theory of operation, minimizing external noise, and the effects of pulsing.
Explore a wide range of support content, including examples and troubleshooting information.