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High-Volume Production Test

Production test leaders need a smarter alternative to traditional automated test equipment (ATE) to meet cost and coverage requirements of increasingly complex RF and mixed-signal ICs.

Analog Devices uses the NI Semiconductor Test System (STS) for both wafer probe final packaged test of its product portfolios ranging from mixed-signal devices to RFICs.

A Smarter Approach to Production ATE

Chipmakers must deliver more integrated functionality, ensure the highest reliability for mission-critical applications, remain highly cost competitive, and ensure a short time to market to meet tight market windows. Consolidation has left the semiconductor ATE market with fewer suppliers, leading to limited options. We think it's time for a change. For 40 years, NI has helped test and measure the devices of the future. Today, we're one of the fastest growing semi production test suppliers because we believe the smarter test solutions of tomorrow—driven by 5G, IoT, and smart vehicle requirements—are customer-defined not vendor-defined.

NI Semiconductor Brochure

Learn more about how you can lower your test cost with a platform-based approach to semiconductor test.

Featured Content

NI’s IC test equipment solutions enabled ON Semiconductor to implement a mixed-signal IC production tester that outperforms other commercially available automated test equipment (ATE).

ON Semiconductor Reduces Test Times With the Semiconductor Test System (STS)

Develop a high-end, scalable, and cost-effective mixed-signal production tester using STS that enables wafer sort and final test for the new generation of image sensors.

NI solutions for the semiconductor testing process, from 5G semiconductor test to mixed signal IC test, provides unprecedented test performance and flexibility.

Use the Strength of the PXI Platform for a Smarter Approach to IC Test

NI's approach to semiconductor test gives engineers the ability to meet operational requirements while reducing cost and maintaining flexibility.

IDT implemented STS systems that provide high-performance measurements across multiple test sites with true parallel test capabilities.

Synergie CAD Instruments Reduces Cost of Test With a Versatile Test System

Synergie CAD Instruments used PXI and TestStand for cost-effective fixture test and repair in line with manufacturing flow, with minimum overhead and sustained productivity.

Products and Solutions

NI Semiconductor Test System

The NI Semiconductor Test System (STS) combines the NI PXI platform with modular instrumentation and system design software to create a test system ready for RF and mixed-signal production test.