With frequency coverage up to 26.5 GHz, NI VNAs have a simplified calibration process through NI InstrumentStudioâ„¢ software for quick and accurate 2-port S-parameter measurements and the characterization of RF components.
In this webinar, learn how the NI PXIe-5633 can be used to conduct modulated and S-parameter measurements when paired with the NI PXIe-5842 VST.
The PXI VNA is part of the NI PXI platform, which combines hardware and software components, including chassis, controllers, and modules, to help you solve complex measurement and automation challenges.
Amid evolving device complexity, shorter cycles, and meeting market demands, the modular PXI platform aids engineers exceed requirements through efficient test automation.
Application Notes
RF Measurement Fundamentals
Understanding RF testing best practices and obtaining accurate results is crucial for efficient test procedures. Learn how to use RF instruments for the measurements required in RF characterization tests.
Explore a wide range of support content, including examples and troubleshooting information.