Perform S-Parameter Measurements
With frequency coverage up to 26.5 GHz, NI VNAs have a simplified calibration process through NI InstrumentStudio™ software for quick and accurate 2-port S-parameter measurements and the characterization of RF components.
Featured Content
The Benefits and Applications of the New 26.5 GHz Vector Network Analyzer
In this webinar, learn how the NI PXIe-5633 can be used to conduct modulated and S-parameter measurements when paired with the NI PXIe-5842 VST.
Overview of the PXI Platform
The PXI VNA is part of the NI PXI platform, which combines hardware and software components, including chassis, controllers, and modules, to help you solve complex measurement and automation challenges.
A New Approach for IC Test
Amid evolving device complexity, shorter cycles, and meeting market demands, the modular PXI platform aids engineers exceed requirements through efficient test automation.
Application Resource
Fundamentals of Building a Test System
Defining a test strategy and planning system investments are critical to reducing cost, optimizing your test-investment life cycle, and maximizing efficiency. Learn test strategies, best practices, and design tradeoffs for your test systems.
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