Add deterministic hardware fault insertion to NI VeriStand by using the example Custom Device to control the NI PXI-2510, 2512, and 2514 Fault Insertion Units (FIU).
Before using the NI VeriStand Custom Device for the NI PXI-2510, 2512, or 2514:
Please note Pre-2019 releases would use the FIU Custom Device and post 2019 releases would use the default Routing and Faulting custom device.
For more information on Custom Devices, please see the white paper on this topic.
The NI PXI-2510 fault insertion unit (FIU) is designed for use in hardware-in-the-loop (HIL) applications and electronic reliability tests. Each module has a set of feedthrough channels, which when closed make the switch transparent to the system. You can open or short these channels to one of two fault buses, each of which offers a multiplexer with four possible inputs. You can use this architecture to simulate open or interrupted connections as well as shorts between pins, shorts to battery voltages, and shorts to ground on a per-channel basis. When controlled with the NI LabVIEW Real-Time Module, this FIU is ideal for validating the reliability of control systems such as engine control units (ECUs), full authority digital engine controls (FADECs), and more with up to 2 A loading conditions.
The NI PXI-2512 fault insertion unit (FIU) is designed for use in hardware-in-the-loop (HIL) applications and electronic reliability tests. Each module has a set of feedthrough channels, which, when closed, make the switch transparent to the system. You can open or short these channels to one of two fault buses. You can use this architecture to simulate open or interrupted connections as well as shorts between pins, shorts to battery voltages, and shorts to ground on a per-channel basis. When controlled with the NI LabVIEW Real-Time Module, this FIU is ideal for validating the reliability of control systems such as engine control units (ECUs), full authority digital engine controls (FADECs), and more with up to 10 A loading conditions.
The NI PXI-2514 fault insertion unit (FIU) is designed for use in hardware-in-the-loop (HIL) applications and electronic reliability tests. Each module has a set of feedthrough channels, which, when closed, make the switch transparent to the system. You can open or short these channels to one of two fault buses. You can use this architecture to simulate open or interrupted connections as well as shorts between pins, shorts to battery voltages, and shorts to ground on a per-channel basis. When controlled with the NI LabVIEW Real-Time Module, this FIU is ideal for validating the reliability of control systems such as engine control units (ECUs), full authority digital engine controls (FADECs), and more with up to 40 A loading conditions.
A typical FIU placement in a dynamic test system for an Engine Control Unit (ECU) is shown below.
The FIU is designed to insert fault conditions between the real-time hardware-in-the-loop (HIL) simulation systems and the ECU/Device Under Test (DUT).
To insert fault conditions, internal relays are configured to create short-circuit connections and open circuits. As mentioned above, automated test applications commonly use the following fault conditions:
FIUs with switchable fault bus inputs can be used to create additional fault conditions, such as a Pin-to-Pin Short Through a Load.
In an FIU’s no-fault setting, test equipment is directly connected to DUT signal lines through the FIU module.
In an open circuit or interrupt fault, the signal line between the test application and DUT is left open to determine how the DUT behaves after a signal interruption.
To simulate shorts to ground or power, the signal line is connected from an external fault line or fault bus to the DUT. The fault buses can be configured to simulate power supply lines or system ground.
In a pin-to-pin short, the DUT signal line is connected to one or more additional DUT signal lines.
The NI PXI-2510 has two fault buses. Each fault bus has four switchable inputs to select among multiple fault conditions such as battery voltage (Vbatt), ground (GND), and other fault voltage potentials. The non-switchable input to each fault bus is intended for monitoring the fault bus with a DMM. The switchable fault bus inputs allow for another fault condition: a pin-to-pin short through a load.
The following example shows a pin-to-pin short through a load using the NI PXI-2510:
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