Test and Qualify Power Semiconductor Devices
Engineers in qualification labs gather extensive data on newly designed power semiconductor DUTs to detect failures and qualify their devices. After the devices are verified, the engineers need to maintain the DUT’s high quality during production, focusing more on throughput than detail. A solution for semiconductor test and qualification must meet the following requirements:
Application Requirements
- Test functions and features such as integrated fully automatic readout functionality, characterization, single DUT tempering, and temperature control—essential for gaining valuable insights during qualification
- Scalability of DUT channels and the ability to test high volumes of DUTs in small spaces, crucial for requalifying DUTs in ongoing production
- High precision and reliability in test equipment to ensure consistent and accurate data collection throughout both qualification and production phases
H(3)TRB and HTGB Test Systems
High-performance test systems:
- Disconnect DUT on failure with integrated, fully automatic readout/characterizations (Rth, Vgs(th), Vds, Vf, Vbreakdown, etc.) and upgrades functions by simply changing cards
- Switch current ranges with current clamping to ~130 percent of current range and latched DUT disable in ~20 ms
- Temper single DUT with ambient temperature control on Tj and regulation accuracy up to +/- 0.25 °C
High-volume test systems:
- Support up to 960 DUTs in a scalable 19" rack, with independent testing for multiples of 80 DUTs and independent environment parameters for multiples of 240 DUTs
- Interface with all common ovens and climate chambers
- Measure current on source and gate for HTGB, handling up to 2000 V, 4 mA/DUT, and gate voltage of +/- 40 V
Solution Advantages
Both high-performance and high-volume test systems offer scalable and flexible testing capabilities with a wide range of test functions, high voltage and current options, and the ability to independently manage multiple DUTs, ensuring precise and reliable results.
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Offer options for both high-performance and high-volume systems.
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Differentiate in terms of the number of DUT channels and technical capabilities, depending on whether you want to focus on characterization or throughput.
See What to Consider When Performing HTBG and H3TRB Tests
H3TRB to Test Insulation Barriers
Gabriel Lieser, Head of Power Semiconductor Research at NI, provides an insightful explanation of HTGB and H3TRB tests. He covers important considerations for conducting these tests, particularly for wide bandgap components, and highlights their significance for various applications in the final product.
BUILD YOUR SOLUTION WITH THE NI ECOSYSTEM
NI offers a variety of solution integration options customized to your application-specific requirements. You can use your own internal integration teams for full system control or leverage the expertise of NI and our worldwide NI Partner Network to obtain a turnkey solution.
The NI Partner Network is a global community of domain, application, and overall test development experts working closely with NI to meet the needs of the engineering community. NI Partners are trusted solution providers, systems integrators, consultants, product developers, and services and sales channel experts skilled across a wide range of industries and application areas.
NI works with customers throughout the life of an application, delivering training, technical support, consultation and integration services, and maintenance programs. Teams can discover new skills by participating in NI-specific and geographic user groups and build proficiency with online and in-person training.
H(3)TRB and HTGB Test Systems Brochure
Get detailed specifications, comprehensive component insights, and more in our brochure. Learn about our scalable, high-performance, and high-volume test systems.
An NI Partner is a business entity independent from NI and has no agency or joint-venture relationship and does not form part of any business associations with NI.