IOL and Power Cycling test systems help you to generate specific stress conditions in your power semiconductor under accelerated conditions. They can efficiently assist with high throughput, seamless monitoring, and low costs. Besides testing silicon-based power semiconductors, the systems are also equipped for SiC and GaN power semiconductors.
What you’ll learn in the brochure:
Explore Cutting-Edge IOL and Power Cycling Test Systems
Enhance testing efficiency, increase throughput, and reduce costs with advanced IOL and power cycling systems featuring seamless monitoring and specialized capabilities for SiC and GaN semiconductors.
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