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Basis Qualification with IOL and Power Cycling

IOL and Power Cycling test systems help you to generate specific stress conditions in your power semiconductor under accelerated conditions. They can efficiently assist with high throughput, seamless monitoring, and low costs. Besides testing silicon-based power semiconductors, the systems are also equipped for SiC and GaN power semiconductors.

What you’ll learn in the brochure:

Methods to enhance measurement quality and achieve high throughput in testing
Strategies for reducing testing costs while maintaining quality
Detailed insights on seamless monitoring and precise parameter determination for each DUT
Capabilities for wide-bandgap technologies, including SiC and GaN power semiconductors
Benefits of a fully automated testing process with comprehensive characterization

Explore Cutting-Edge IOL and Power Cycling Test Systems

Enhance testing efficiency, increase throughput, and reduce costs with advanced IOL and power cycling systems featuring seamless monitoring and specialized capabilities for SiC and GaN semiconductors.

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