Explore the capabilities of dynamic H3TRB and DRB test systems for SiC and GaN semiconductors. Learn about our advanced reliability testing solutions tailored to your applications, tackling overlooked failure mechanisms with precision. Our tools help you gain insights into corrosion’s impact, ensuring power semiconductor robustness and longevity.
Here’s how our H3TRB and DRB test solutions transform your test process:
Up to 240 DUT channels per system with cutting-edge measurement technology
Configurable output frequency for maximum flexibility
Prioritize adaptability with a focus on meeting changing requirements
Streamline your testing process with advanced software automation features
Unlock Advanced Testing Solutions
Cutting-edge reliability testing for SiC and GaN power semiconductors helps you enhance your understanding of material resilience and performance optimization.
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