Enhanced DGS Testing for SiC and GaN Semiconductors

Discover how Dynamic Gate Stress testing empowers you to harness the full potential of SiC and GaN power semiconductors. Learn how our DGS test system mechanisms enable optimized performance and reliability for your products.

 

SiC and GaN power semiconductor

 

Here’s what’s included in the brochure:

 

  • Learn about DGS testing benefits and how it enhances your testing process.

  • Explore NI’s DGS test system solutions and their transformative impact.

  • Achieve seamless testing with up to 240 DUT channels and configurable settings.

  • Get software support that ensures precise testing customized to your needs. 

See How to Achieve Test Excellence with NI’s DGS Solutions

Gain a competitive edge with valuable insights into dynamic gate stress testing for SiC and GaN power semiconductors. Get to know our advanced reliability testing solutions and stay ahead of industry standards.

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