Wafer-Level Reliability Test Toolkit

The Wafer-Level Reliability Test Toolkit provides stress and measurement techniques for reliability estimation.

The Wafer-Level Reliability (WLR) Test Toolkit is a software add-on for LabVIEW. You can use this add-on with PXI Source Measure Units to perform semiconductor device reliability estimation at the extreme voltage and temperature ends of the device specifications. The add-on helps you use negative bias temperature instability and hot-carrier injection mechanisms to stress and measure the response of a device to monitor for signs of degradation. You can perform these tests on a wafer or a packaged level. The WLR Test Toolkit also provides visualizations for measurement and analysis data.

产品编号： 787133-35