Modular Data Acquisition
Distributed Measurement and Control
High-Performance Test
Automated Test System Development Software
Perspectives showcases how NI sees what’s next in the world of test and technology.
You can request repair, RMA, schedule calibration, or get technical support. A valid service agreement may be required.
Provides support for NI data acquisition and signal conditioning devices.
Provides support for Ethernet, GPIB, serial, USB, and other types of instruments.
Provides support for NI GPIB controllers and NI embedded controllers with GPIB ports.
Switches facilitate signal routing between instruments and devices or units under test (DUTs and UUTs). Use these products to conduct general functional tests, semiconductor parametric tests, radar tests, high-power fault insertion, and more.
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