The NI TestStand 2016 Semiconductor Module f4 patch resolves the issues outlined in the table below. This installer includes all TSM 2016 components, so it's not necessary to install TSM 2016 before installing this patch. NI recommends this patch for all applications using TSM 2016. You download it directly through the following Downloads page:
TestStand 2016 Semiconductor Module f4 Patch (32-bit)
TestStand 2016 Semiconductor Module f4 Patch (64-bit)
| ID | Description |
|---|---|
| 679251 | DUTs that produced a run-time error during testing appeared as passed in STDF file, but were appropriately binned. |
| 600508 | The TestStand Semiconductor Module fails to call the LabVIEW event callback for the ErrorOccurred event. |
| 598494 | Some legacy digital example LabVIEW VIs are not saved in the correct version of LabVIEW. |
| 611229 | If you view the per site inputs panel of a Semiconductor Action step followed by a MultiTest step (or vice versa), an error dialog appears. |
| 626657 | If a code module executes on all sites because the subsystem includes all sites or because the "One thread only" setting is enabled and the sites in the Semiconductor Module context are not in numerical order, the Set Site Data VI stores the site data incorrectly. |
| 563825 | NI_TestStand_Semiconductor_Module.lvlibp was rebuilt to address LabVIEW CAR 563825, which can cause LabVIEW 2014 SP1 64-bit to crash in rare circumstances. |
| 630043 | The Extract Pin Data VI can return incorrect values when using the Parametric:1D Array polymorphic instance |
What's New
The Standard Test Data Format (STDF) Log result processing plug in now generates summary records for the Hardware Bin Record (HBR), Software Bin Record (SBR), Test Synopsis Record (TSR), and Part Count Record (PCR) records. The records are included at the end of the STDF log file and have a HEAD_NUM value of 255 to indicate that they are summary records.