This document contains the TestStand Semiconductor Module known issues
that were discovered before and since the release of
TestStand 2016 Semiconductor Module. Not every issue known to NI will appear on this
list; it is intended to only show the severe and more common issues
that can be encountered.
Each Issue appears as a row in the table and
includes these fields:
The Known Issues Document is divided into two separate tables appearing in two separate documents. The following document displays the issues by date.
For those who wish to locate issues by their category, we have also published another version of the known issues table organized by the category of issue, and sorted by the date the issue was added to the document (not necessarily the date the issue was reported to NI). This table is recommended for use in helping determine if an issue has been reported to us, and is also recommended for users wanting to skim the document to learn of potential issues they may face with TestStand 2016 Semiconductor Module during development. If an issue has multiple categories, it will appear multiple times in this document.
TestStand 2016 Semiconductor Module Known Issues by Category
Feel free to contact NI regarding this document or issues in the document. If you are contacting NI in regards to a specific issue, be sure to reference the ID number given in the document to the NI representative. The ID number contains the current issue ID number as well as the legacy ID number (use the current ID number when contacting National Instruments). You can contact us through any of the normal support channels including phone, email, or the discussion forums. Visit the NI Website to contact us. Also consider contacting us if you find a workaround for an issue that is not listed in the document so that we can add the workaround to the document.
The following items are known issues in TestStand 2016 Semiconductor Module sorted by Date.
| ID | Known Issue | |||||
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| 396711 Return | Second error dialog box appears after run-time error occurs when incorrectly using the Set and Lock Bin step When you use a Set and Lock Bin step in a sequence file and run Single Pass using the Batch model, a run-time error occurs because the step sets the bin to 0 by default. If you do not specify a bin definitions file, bin 0 is a fail bin. When the sequence passes and tries to determine the final bin, it reports a run-time error because the sequence passed but the bin was set to a fail bin. After that run-time error is reported, a second run-time error occurs and indicates that "One or more test sockets have unexpectedly stopped executing". Workaround: Ignore the second error dialog box and configure a bin definitions file.
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| 457832 Return | TestStand Semiconductor Module Operator Interface Test Program Information control does not clear values when switching from a sequence with a configuration to one without In the TestStand Semiconductor Module Operator Interface, the Test Program Information control updates values to match the test conditions of the current configuration and the station settings. However, if you switch from a sequence file that has a configuration, and thus populated the control with values, to a sequence file that does not have a configuration and has no values to populate it with, the Test Program Information control does not clear itself and continues to show the old values. Workaround: If it is required to execute sequence files without test configurations, modify the operator interface code to handle this use case.
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| 505457 Return | The Number of Sites control in the Configure Station Settings dialog box does not affect the number of sites when executing with the Sequential model When executing with the TestStand Sequential model, only one site is allowed. However, the Configure Station Settings dialog box displays the number of sites that would run if the Parallel or Batch model were used. Workaround: N/A
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| 517287 Return | TestStand Seminconductor Module .NET APIs do not appear in the Visual Studio Add References dialog box when 64-bit TestStand is installed but 64-bit TestStand Semiconductor Module is not If 32-bit and 64-bit TestStand are installed but only 32-bit TestStand Semiconductor Module is installed, the TestStand Seminconductor Module .NET Code Module API and Application API do not appear in the Add References dialog box in Visual Studio. Workaround: Install 64-bit TestStand Semiconductor Module or add the reference to the Visual Studio project manually by browsing to <TestStand>\API\DotNET\Assemblies\CurrentVersion.
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| 528021 Return | TestStand Semiconductor Module result processors do not appear in the Result Processing dialog box If the Result Processing dialog box has been opened at least once before the TestStand Semiconductor Module is installed, the installer is unable to update the items in the Result Processing dialog box. Workaround: Follow the instructions documented in the "Enabling and Configuring Semiconductor Module Result Processing Plug-ins" topic in the TestStand Semiconductor Module Help.
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| 529670 Return | The license activation dialog box in the installer for a TestStand deployment that contains the TestStand Semiconductor Module Runtime incorrectly labels the serial number field as "TestStand" instead of "TestStand Semiconductor Module" A TestStand Semiconductor Module serial number will activate the product. If TestStand 2014 SP1 or later is installed, the dialog box displays the correct label. Workaround: N/A
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| 555661 Return | Building the TestStand 2014 Semiconductor Module LabVIEW operator interface executable after installing TestStand 2014 Semiconductor Module SP1 might result in build errors When you build an existing TestStand 2014 Semiconductor Module LabVIEW operator interface executable after you install TestStand 2014 Semiconductor Module SP1, the build operation might fail with a build error with text similar to the following: Click the link below to visit the Application Builder support page. Use the following information as a reference: Error 1 occurred at EndUpdateResourceA.vi. Workaround: Mass compile the LabVIEW operator interface project before building.
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| 557654 Return | Importing limits from a test limits file that changes the evaluation type of a test might not correctly set the flags on the test properties If you import test limits into a sequence file with the Update limits in matching tests option enabled and the import operation changes the Evaluation Type of an existing test, certain flags on the test properties are set incorrectly. These flags do not affect execution of the test program because the Semiconductor Multi Test step corrects the settings at run time. The specific flag involved is the Dont Copy To Results flag on the NumericLimit or PassFail properties.Workaround: N/A
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| 558650 Return | Cancelling installation of TestStand 2014 Semiconductor Module SP1 might leave TestStand 2014 Semiconductor Module in a bad state The TestStand 2014 Semiconductor Module SP1 installer first un-registers some files from the TestStand 2014 Semiconductor Module but is unable to re-register the files if the installer cancels before completing. Workaround: Run the TestStand Version Selector and make TestStand 2014 active to re-register the files.
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| 562103 Return | TestStand might launch a license activation dialog box after you install TestStand Semiconductor Module for one bitness and start TestStand for the other bitness before activating the TestStand Semiconductor Module If you have 32-bit and 64-bit TestStand installed and you install TestStand Semiconductor Module for either 32-bit or 64-bit, then start TestStand with the bitness for which you did not install TestStand Semiconductor Module, a license activation dialog box launches with a blank entry for the product that needs to be activated. The dialog box no longer displays after you activate the TestStand Semiconductor Module license. Workaround: Activate the license for the TestStand Semiconductor Module or install the TestStand Semiconductor Module for both bitness versions of TestStand.
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| 563547 Return | In rare cases, certain steps that use the LabVIEW Adapter and default values might report run-time errors when using a test program configuration that loads limits Certain rare combinations of default values for array parameters on LabVIEW steps can cause a run-time error when running a test program with a configuration that loads limits from a test limits file. Workaround: On the step that reports a run-time error, change the step load option to Load Dynamically and the unload option to Unload after the step executes.
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| 590475 Return | You must restart the computer to install the TestStand Semiconductor Module after you install TestStand, which prevents silent installs The TestStand Semiconductor Module relies on a reboot of the computer after you install TestStand. If you do not restart the computer, a modal dialog box returns the following error: The TestStand Service did not start up promptly.The TestStand Engine uses this service to ensure that external environments such as LabVIEW, LabWindows/CVI, and Microsoft Visual Studio are properly updated. The TestStand Service can sometimes be delayed after restarting a system if a previous service is slow to start. For example, the Windows Workstation service can delay for a few minutes on startup when trying to reconnect to mapped network drives if the drives are not immediately available. Determine the offending service and see if you can resolve why it is slow to start. An option is to mark the service as manual, and delay the launching of it by adding a command to the startup group to start the service. Because a modal dialog box returns the error, a silent installation (including an installer running in silent mode that you build with the Batch Installer Builder) cannot complete successfully.Workaround: N/A
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| 596009 Return | LabVIEW operator interfaces built in LabVIEW 2016 might be slow to exit When you exit a LabVIEW operator interface built in LabVIEW 2016, the operator interface might be slow to terminate. Workaround: Rebuild the operator interface in LabVIEW 2015 SP1 or earlier.
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| 596546 Return | Cycle and socket times might temporarily increase after you click inside the Bin Summary Table of the LabVIEW operator interface while executing a lot Clicking inside the Bin Summary Table of the TestStand Semiconductor Module LabVIEW operator interface while executing a lot might result in temporarily increased cycle and socket times. The overall performance degradation is more pronounced with higher site counts. Workaround: Add a filter event case to the Event structure in the main execution loop for the 'Mouse Down?' event on the Bin Summary Table control. Wire a True Boolean constant to the 'Discard?' event filter node of the 'Mouse Down?' filter event case to discard mouse down events that occur inside a cell of the Bin Summary Table.
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| 597659 Return | In certain cases, using CPU Affinity step might cause some threads to suspend intermittently for several seconds This behavior might occur when you configure the CPU Affinity step to use fewer cores than are available in processors with eight or more cores. Workaround: N/A
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| 612228 Return | Launching the Digital Pattern Editor from the TestStand Semiconductor Module does not always bring the existing editor to the front When an instance of the Digital Pattern Editor is running, attempting to launch the Digital Pattern Editor from the TestStand Semiconductor Module does not always bring the existing editor to the front. If the Digital Pattern Editor was originally launched from the Start menu, the TestStand Semiconductor Module instead launches a new instance of the Digital Pattern Editor. Workaround: Manually navigate to an existing instance of the Digital Pattern Editor instead of using the TestStand Semiconductor Module shortcut to bring the existing instance of the editor to the front.
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| 647125 Return | TSM bins the part correctly but reports incorrect measurement data when a step errors out If a Semiconductor Multi Test step produces an error on a run other than the first in a lot, TSM logs the measurements of the step from the previous batch. TSM bins the DUT correctly, and the step returns an error. Workaround: Disable the Optimize Non-Reentrant Calls to this Sequence option on all sequences that return report data in the sequence file.
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| 651595 Return | Memory usage can increase when using reentrant VIs and testing a high number of sites Testing with many sites that call reentrant VIs can cause increased memory use because TestStand creates a clone of a reentrant VI in each thread where the VI executes. Duplicate clones can be created because the thread used depends on the order at which the sites arrive at the step. The order can vary when you test with many sites. Workaround: N/A
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| 669922 Return | Run-time errors occur when looping on TSM steps Intermittent errors can occur if you use TSM steps in a loop or enable looping settings in certain multisite situations. Workaround: Avoid using loops with TSM step types or ensure that the last step in a loop block is a Semiconductor Multi Test step with the Multisite Option set to One thread only.
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