Each issue appears as a row in the table and includes the following fields:
| ID | Known Issue | |||||
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| 611267 Return | Digital Pattern Editor might crash when opening a project immediately after closing it The Digital Pattern Editor might crash when you open a project immediately after you close it on slower computers or on virtual machines. Workaround: Avoid using the Digital Pattern Editor on slower computers or on virtual machines.
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| 611269 Return | Digital Pattern Editor might crash when closing a project immediately after opening it The Digital Pattern Editor might crash when you close a project immediately after you open it and before the project has finished opening. Workaround: When you open large projects, wait for the project to finish loading before you close the project. Avoid rapidly opening and closing multiple projects.
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| 611275 Return | Launching the Digital Pattern Editor from the TestStand Semiconductor Module does not always bring the existing editor to the front When an instance of the Digital Pattern Editor is running, attempting to launch the Digital Pattern Editor from the TestStand Semiconductor Module does not always bring the existing editor to the front. If the Digital Pattern Editor was originally launched from the Start menu, the TestStand Semiconductor Module instead launches a new instance of the Digital Pattern Editor. Workaround: Manually navigate to an existing instance of the Digital Pattern Editor instead of using the TestStand Semiconductor Module shortcut to bring the existing instance of the editor to the front.
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| 611808 Return | Errors occur when using NI-Digital with the TestStand Semiconductor Module if the TestStand Semiconductor Module 2016 f1 Patch has not been installed If you use NI-Digital 16.0 with the TestStand Semiconductor Module, you must install the TestStand Semiconductor Module 2016 f1 patch to resolve multiple compatibility issues. Failing to install the f1 patch for the TestStand Semiconductor Module prevents you from using the NI-Digital .NET API and causes examples to not function properly. Workaround: You can download the TestStand Semiconductor Module 2016 f1 patch from the following location: TestStand Semiconductor Module 2016 f1 (32-bit) TestStand Semiconductor Module 2016 f1 (64-bit)
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| 651023 Return | Running the digital scope in demo mode without the pattern open in the Digital Pattern Editor returns an incorrect error When you run the digital scope in demo mode and the pattern is not open in the editor, the editor returns the error: "Could not find pattern file path in list of loaded patterns". The pattern must be open in a document in the editor before you can execute digital scope in demo mode. Workaround: Open the pattern in the editor before running digital scope on it.
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| 608222 Return | Changing the active pin map file of a project while executing can lead to unexpected behavior Changing, deleting, excluding, or making the current active pin map file inactive while the Digital Pattern Editor is executing can lead to unexpected behavior. Workaround: Wait until the execution finishes or abort the current execution before changing, deleting, excluding, or making the current active pin map file inactive.
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| 605969 Return | Launching Digital Pattern Editor from a network drive crashes on startup or gives unexpected errors when evaluating formulas The Digital Pattern Editor currently does not support being installed on or being run from a network drive. Workaround: Install the Digital Pattern Editor to a local location and run the editor from that location.
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| 651772 Return | Using the Delete key in Time Set Name fields crashes the Digital Pattern Editor Clearing the Time Set Name fields by using the Delete key causes the editor to crash. Workaround: Use the context menu option to delete the row. To clear the cell, double-click in the cell to in-place edit.
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| 651018 Return | Editing a pin state immediately after inserting a new pin item sometimes edits the wrong cell When you edit a pattern in the Digital Pattern Editor, editing the already selected pin state cell after inserting a new pin item column can sometimes cause the cell in the original column at that location to be edited instead of the cell in the current column. Workaround: Change the selection at least once after inserting a new pin item column in the pattern.
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| 644093 Return | Digital Pattern Editor sometimes does not preserve window layout The Digital Pattern Editor might not preserve the window layout when you close and reopen the application. Workaround: Close the application, delete the .digiprojcache file associated with the project, reopen the project, reset the window layout, and save the project.
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| 672936 Return | Capturing a waveform with zero samples or an incomplete sample causes the Digital Pattern Editor to hang When a waveform captures zero samples (no capture opcode executes between capture_start and capture_stop opcodes) or a serial waveform captures an incomplete sample in which the number of bits captured does not make up a whole sample (the sample width is greater than the number of bits captured), the Digital Pattern Editor hangs when you burst the pattern. Workaround: Ensure patterns capture at least one complete sample for waveforms with capture_start and capture_stop opcodes in the pattern.
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| 673974 Return | Settings in the Instrument Settings pane have no effect if you are using a newly created project When you create a new project, the Digital Pattern Editor might get into a state in which changing settings in the Instrument Settings pane does not take effect. This issue persists until you close and reopen the project or restart the Digital Pattern Editor. This is not an issue with the project files themselves. It is an issue caused by the creation of a new project. Workaround: Close the project and reopen it or restart the Digital Pattern Editor.
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| 673746 Return | HRAM may return an incomplete set of failures if HRAM is configured to use pretrigger samples and capture failures only If the HRAM settings within the Digital Pattern Editor are configured to have the Cycles to Capture to Failures Only and the Pretrigger Cycles is greater than 0, the failures captured may be different than the requested failures. All returned failures are actual failures, but some of the failures that were requested may not be returned. Workaround: Setting the Cycles to Capture to All will guarantee the correct samples are captured.
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Contact NI regarding this document or issues in the document. If you contact NI in regards to a specific issue, reference the ID number given in the document. The ID number contains the current issue ID number as well as the legacy ID number (use the current ID number when contacting NI). You can contact us through any of the normal support channels including phone, email, or the discussion forums. Also contact us if you find a workaround for an issue that is not listed in the document.