Each issue appears as a row in the table and includes the following fields:
| ID | Known Issue | |||||
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| 598468 Return | Displays using high DPI settings are not fully supported The Digital Pattern Editor currently does not fully support systems that use high DPI settings, such as125% or 150%. Workaround: Use the Microsoft Windows default DPI value of 100%.
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| 600028 Return | Digital Pattern Editor can become less responsive when attaching to sessions When attaching to an existing instrument session from another application, such as TestStand or LabVIEW, the Digital Pattern Editor can become less responsive. This situation can happen when the editor is unable to successfully connect to enough sessions to complete a site from the active pin map, such as when some instruments in the pin map do not exist, instruments used in the pin map are not configured for remote debugging, or when instrument sessions used in the pin map are externally halted at a breakpoint and the instrument session is not enabled for breakpoints. Workaround: Ensure that when using the Digital Pattern Editor to attach to existing sessions, such as from TestStand or LabVIEW, that all sessions used in the pin map exist and are available to attach to. Ensure that devices used in the pin map enable Debug Session and Breakpoints. Select Instruments »Configure Debugging to enable Debug Session and Breakpoints.
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| 603853 Return | Duplicate pattern and waveform names are not supported NI recommends that no two patterns share the same name, no two source waveforms share the same name, and no two capture waveforms share the same name. Workaround: Ensure that each pattern and waveform in the project uses a unique name.
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| 608380 Return | Ambiguous formulas might produce unexpected results Removing optional spaces can sometimes cause formulas to resolve ambiguously. For example, instead of using "3--2 " as a formula for "three minus negative two", use an optional space: "3 - -2". Additionally, when you use a comma as a decimal mark, use a semicolon to separate parameters in a parameter list. For example, instead of using "max(1,2,3,4) ", use "max(1, 2, 3, 4) " or "max(1,2; 3,4) ". Workaround: Use optional spaces when appropriate to avoid ambiguity.
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| 611267 Return | Digital Pattern Editor might crash when opening a project immediately after closing it The Digital Pattern Editor might crash when you open a project immediately after you close it on slower computers or on virtual machines. Workaround: Avoid using the Digital Pattern Editor on slower computers or on virtual machines.
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| 611269 Return | Digital Pattern Editor might crash when closing a project immediately after opening it The Digital Pattern Editor might crash when you close a project immediately after you open it and before the project has finished opening. Workaround: When you open large projects, wait for the project to finish loading before you close the project. Avoid rapidly opening and closing multiple projects.
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| 611275 Return | Launching the Digital Pattern Editor from the TestStand Semiconductor Module does not always bring the existing editor to the front When an instance of the Digital Pattern Editor is running, attempting to launch the Digital Pattern Editor from the TestStand Semiconductor Module does not always bring the existing editor to the front. If the Digital Pattern Editor was originally launched from the Start menu, the TestStand Semiconductor Module instead launches a new instance of the Digital Pattern Editor. Workaround: Manually navigate to an existing instance of the Digital Pattern Editor instead of using the TestStand Semiconductor Module shortcut to bring the existing instance of the editor to the front.
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| 611808 Return | Errors occur when using NI-Digital with the TestStand Semiconductor Module if the TestStand Semiconductor Module 2016 f1 Patch has not been installed If you use NI-Digital 16.0 with the TestStand Semiconductor Module, you must install the TestStand Semiconductor Module 2016 f1 patch to resolve multiple compatibility issues. Failing to install the f1 patch for the TestStand Semiconductor Module prevents you from using the NI-Digital .NET API and causes examples to not function properly. Workaround: You can download the TestStand Semiconductor Module 2016 f1 patch from the following location: TestStand Semiconductor Module 2016 f1 (32-bit) TestStand Semiconductor Module 2016 f1 (64-bit)
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| 649745 Return | The Digital Pattern Compiler does not validate the pattern file_format_version number in .digitpatsrc files Using a pattern file_format_version other than 1.0 with version 16.0 of the Digital Pattern Editor and Compiler might cause the compiled file to be unloadable or to load incorrectly in a future version of the editor or compiler. Future versions of the editor and compiler might create files that do not load in version 16.0, but version 16.0 of the editor might attempt to load those files anyway. Workaround: Always use file_format_version 1.0 with .digipatsrc files used with version 16.0 of the digital pattern editor and compiler.
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| 651023 Return | Running the digital scope in demo mode without the pattern open in the Digital Pattern Editor returns an incorrect error When you run the digital scope in demo mode and the pattern is not open in the editor, the editor returns the error: "Could not find pattern file path in list of loaded patterns". The pattern must be open in a document in the editor before you can execute digital scope in demo mode. Workaround: Open the pattern in the editor before running digital scope on it.
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| 608222 Return | Changing the active pin map file of a project while executing can lead to unexpected behavior Changing, deleting, excluding, or making the current active pin map file inactive while the Digital Pattern Editor is executing can lead to unexpected behavior. Workaround: Wait until the execution finishes or abort the current execution before changing, deleting, excluding, or making the current active pin map file inactive.
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| 605969 Return | Launching Digital Pattern Editor from a network drive crashes on startup or gives unexpected errors when evaluating formulas The Digital Pattern Editor currently does not support being installed on or being run from a network drive. Workaround: Install the Digital Pattern Editor to a local location and run the editor from that location.
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| 672936 Return | Capturing a waveform with zero samples or an incomplete sample causes the Digital Pattern Editor to hang When a waveform captures zero samples (no capture opcode executes between capture_start and capture_stop opcodes) or a serial waveform captures an incomplete sample in which the number of bits captured does not make up a whole sample (the sample width is greater than the number of bits captured), the Digital Pattern Editor hangs when you burst the pattern. Workaround: Ensure patterns capture at least one complete sample for waveforms with capture_start and capture_stop opcodes in the pattern.
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| 673746 Return | HRAM may return an incomplete set of failures if HRAM is configured to use pretrigger samples and capture failures only If the HRAM settings within the Digital Pattern Editor are configured to have the Cycles to Capture to Failures Only and the Pretrigger Cycles is greater than 0, the failures captured may be different than the requested failures. All returned failures are actual failures, but some of the failures that were requested may not be returned. Workaround: Setting the Cycles to Capture to All will guarantee the correct samples are captured.
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Contact NI regarding this document or issues in the document. If you contact NI in regards to a specific issue, reference the ID number given in the document. The ID number contains the current issue ID number as well as the legacy ID number (use the current ID number when contacting NI). You can contact us through any of the normal support channels including phone, email, or the discussion forums. Also contact us if you find a workaround for an issue that is not listed in the document.