Wafer yield, or the percentage of accepted die per wafer, is a critical metric for semiconductor operations. All fab processes must ramp to steadily create consistent wafers with profitable average yield. This yield is determined during wafer test and sort when each die is assigned to a specific scrap or product bin based on parametric data. Tracking ongoing yield results ensures key metrics stay above minimum thresholds. To do so, operations require certain levels of visibility, including:
Uses the OptimalPlus data pipeline built for semiconductor data for a stable and complete source to support wafer yield insights.
Delivers the right KPIs to the right people in near real-time through prebuilt and customizable dashboards, visualizations, and analytics
Enables semiconductor operations to catch and fix yield issues fast through data-driven rules with predefined responses for wafer data
Tracks outsourced operations and supplier benchmarks with broad foundry and OSAT support
NI offers a variety of solution integration options customized to your application-specific requirements. You can use your own internal integration teams for full system control or leverage the expertise of NI and our worldwide NI Partner Network to obtain a turnkey solution.
The NI Partner Network is a global community of domain, application, and overall test development experts working closely with NI to meet the needs of the engineering community. NI Partners are trusted solution providers, systems integrators, consultants, product developers, and services and sales channel experts skilled across a wide range of industries and application areas.
NI Enterprise Solutions provide architecture and applications that improve product lifecycle performance. NI service teams offer dedicated data science, engineering, and project management resources to guide users through complete data mapping and focused deliverables for successful solution deployment. Talk to your NI representative about service options while learning more about NI Enterprise Solutions.