Device Testing with Digital Pattern Instruments Course Overview

Creating and Bursting Your First Pattern

Configuring a pin map, level sheet, timing sheet, and pattern file, bursting a digital pattern to the device under test (DUT).

• PXI Digital Pattern Instruments

Creating Pin Maps

Creating pin maps in Digital Pattern Editor to define DUT connection sites.

• Exploring Pin Maps

Creating Specifications Sheets

Storing values from the data sheet of DUT in specifications sheet variables. 

• Exploring Specifications Sheets

Creating Pin Levels Sheets

Create pin levels sheets to define the supply voltages, termination, and logic levels for the DUT.

• Exploring Pin Levels Sheets

Creating Timing Sheets

Creating timing sheets to define the timing characteristics of the interface with the DUT.

• Exploring Timing Sheets

Creating Pattern Files

Create pattern files to communicate with and test the DUT.

• Introduction to Patterns
• Working with Patterns

Programming Digital Patterns

Programmatically controlling Digital Pattern Instruments using NI-Digital Pattern API.

• Exploring the Digital Pattern Instrument Software Flow
• Creating a Session and Controlling States
• Editing Pin Maps with the NI-Digital Pattern API
• Editing Pin Levels with the NI-Digital Pattern API
• Editing Time Sets with the NI-Digital Pattern API
• Loading Files with the NI-Digital Pattern API

Testing DUT Modes of Operation

Configuring the DUT with Serial Peripheral Interface (SPI) commands to test its modes of operations.

• Exploring SPI Communication

Performing Register Readback Tests

Performing a register readback test to validate the communication capabilities of the DUT.

• Introducing Register Readback Testing

Validating DUT Timing

Interfacing with external test equipment to validate the DUT timing.

• Introducing DUT Timing Validation

Performing Continuity and Leakage Testing

Performing continuity and leakage tests to validate DUT pin connections.

• Introduction to Continuity and Leakage Testing
• Exploring Pin Parametric Measurement Unit (PPMU) Fundamentals

Increasing Pattern Robustness with Flow Control

Increasing the robustness of a pattern by using opcodes to establish flow control.

• Introducing Opcodes in Digital Pattern Editor
• Using Repeat and Loop Opcodes in Pattern
• Exploring Jump and Call Opcodes
• Using Conditional Behavior
• Exploring Sequencer Flags and Registers Opcodes

Using Source Waveforms

Using serial and parallel source waveforms to simplify a pattern structure with variable data.

• Exploring Source Waveforms
• Configuring Serial Source Waveforms
• Using Serial Source Waveforms in Patterns 
• Exploring Source Pin State Replacement 
• Loading and Unloading Source Waveforms 
• Configuring Parallel Source Waveforms
• Using Parallel Source Waveforms in Patterns 
• Source Bandwidth Considerations

Using Capture Waveforms

Using capture waveforms to store received data for validation and post-processing.

• Exploring Capture Waveforms
• Configuring Serial Capture Waveforms
• Configuring Parallel Capture Waveforms
• Using Capture Waveforms in Patterns
• Loading and Unloading Capture Waveforms
• Capture Waveform Considerations 

Reviewing Test Results with History RAM Report

Using the result of the History RAM report to debug pattern or device under test (DUT).

• Exploring History RAM
• Using NI-Digital History RAM API 
• Memory and Bandwidth Considerations

Viewing Signals with Digital Scope

Using digital scope to view the actual voltage levels on the pins of Digital Pattern Instrument (PXIe-657x).

• Exploring Digital Scope
• Configuring and Using Digital Scope

Using Shmoo Plots to Visualize Parameter Relationships

Use Shmoo plots to iterate over pattern parameters and view results.

• Exploring Shmoo Plots
• Exploring Shmoo Plot Execution Modes

Synchronizing with Other Instruments

Implementing synchronization strategies such as sharing triggers or using NI-TClk to coordinate tasks with other instruments.

• Generating Triggers Interactively
• Generating Triggers Programmatically
• Using NI-TClk with Multiple Instruments 
• Detecting Match or Fail Conditions
• Synchronization Methods Overview

Wiring and Calibration

Compensating for cable skew and voltage offsets and exploring device calibration requirements.

• Configuring Time Domain Reflectometry
• Connecting DUT Ground Sense
• Calibrating Digital Pattern Devices

Using Opcodes for Scan Testing

Using the scan opcode to divide a vector into one or more scan cycles.

• Exploring Scan Patterns