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Testing RFICs With the STS

Updated Dec 6, 2022

Overview

Learn how to lower test cost by testing multiple WLAN front-end modules in parallel. The Semiconductor Test System (STS) takes advantage of the PXI platform and high-performance PXI instrumentation to offer a lower cost approach to RFIC production test. In this demonstration, you not only learn about STS test coverage such as S-parameters and error vector magnitude measurements but also explore specialized test software for semiconductor production test.

Next steps

Learn more about the NI Semiconductor Test Systems.
Learn more about other semiconductor solutions from NI
Watch how semiconductor company Analog Devices went from commercial off-the-shelf automated test equipment to the PXI-based Semiconductor Test System

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