NI Multisim Simulation Driven Instruments and Analyses Feature Comparison

Contents

Overview

NI Multisim provides a powerful, yet simple interface for professional engineers to utilize SPICE simulation in their design process. The simulation process in Multisim is split into two basic steps;

  1. Validate the transient behavior of a circuit with interactive simulation and simulation driven instruments
  2. Utilize advanced SPICE simulation analyses to further investigate circuit behavior

This article showcases the various virtual instruments and analyses that are available in the Base, Full and Power Pro editions of Multisim

 

NI Multisim Simulation Driven Instruments

The following chart displays the simulation driven instruments in Multisim (Base, Full and Power Pro editions).  

To learn more about the virtual instruments, view the "Overview of NI Multisim Virtual Instruments" article.

Instrument

 

Base

 

Full

 

Power Pro

 

2 Channel Scope
4 Channel Scope  
Ammeter 
Bode Plotter 
Current Probe 
Distortion Analyzer 
Frequency Counter 
Frequency Generator
IV Analyzer  
Logic Analyzer 
Logic Converter 
Measurement Probe
Multimeter
Network Analyzer  
Spectrum Analyzer  
Voltmeter 
Wattmeter 
Word Generator 
NI ELVISmx Arbitrary Waveform Generator* 
NI ELVISmx Digital Reader* 
NI ELVISmx Digital Writer* 
NI ELVISmx Digital Multimeter* 
NI ELVISmx Dynamic Signal Analyzer* 
NI ELVISmx Function Generator* 
NI ELVISmx Oscilloscope* 
NI ELVISmx Variable Power Supply* 
Agilent Function Generator  
Agilent Multimeter 
Agilent Scope  
Tektronix Scope  
 
* You must install the NI ELVISmx driver in order to activate these instruments. Download here.

 

NI Multisim SPICE Analyses

The following chart displays the SPICE analyes in Multisim (Base, Full and Power Pro editions).

 

Analysis

 

Base

 

Full

 

Power Pro

 

AC 
AC Single Frequency 
Batched  
DC Operating Point 
DC Sweep 
Distortion 
Fourier 
Monte Carlo 
Nested Sweep  
Noise 
Noise Figure  
Parameter Sweep 
Pole Zero 
Sensitivity 
Temperature Sweep 
Trace Width 
Transfer Function 
Transient 
User Defined  
Worst Case 

 

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