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From 11:00 PM CST Friday, Feb 14th - 6:30 PM CST Saturday, Feb 15th, ni.com will undergo system upgrades that may result in temporary service interruption.
We appreciate your patience as we improve our online experience.
Wideband 5G IC test complexity can drive up costs, delay timelines, and hurt quality—especially with sub-6 GHz and mmWave IC test. How can you tame test complexity? You need the right tools and procedures. Get NI’s expert recommendations, so you can streamline and speed up your tests.
Overcome Your Top 5G Test Challenges with NI Guidance:
See How to Streamline Your 5G Semiconductor Test
A must-read for anyone navigating the time, cost, and quality trade-offs of testing semiconductor devices for wideband 5G applications.
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