Tame 5G Semiconductor Test Complexity
Wideband 5G IC test complexity can drive up costs, delay timelines, and hurt quality—especially with sub-6 GHz and mmWave IC test. How can you tame test complexity? You need the right tools and procedures. Get NI’s expert recommendations, so you can streamline and speed up your tests.
Overcome Your Top 5G Test Challenges with NI Guidance:
- Work with wide 5G downlink and uplink OFDM waveforms.
- Configure wideband test benches for extensive frequency coverage.
- Avoid common errors in 5G beamforming.
- Reduce test times of over-the-air TX and RX test procedures.
- Choose alternatives to RF chambers for high-volume production of mmWave RFICs.
See How to Streamline Your 5G Semiconductor Test
A must-read for anyone navigating the time, cost, and quality trade-offs of testing semiconductor devices for wideband 5G applications.
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