The Test Program Development with STS course delivers hands-on training for setting up and using a Semiconductor Test System (STS) to communicate with a device under test (DUT). The course will follow the typical semiconductor test workflow and milestones, which includes tight interaction with corresponding hardware. After completing this course, a test engineer will be able to use STS tester resources interactively to create, modify, execute, and debug test programs with pre-existing code modules (developed using LabVIEW or .NET/C#) to collect test data and test time reports.
Course Last Release Date or Version Number: On-Demand: 23.0
On-Demand: 5 hours
Semiconductor test engineers using or evaluating the NI Semiconductor Test System (STS) to perform semiconductor production test or high-volume automated device validation.
General knowledge of semiconductor test strategies and methods
General computer proficiency
Basic test engineering knowledge
STS Software Bundle
Semiconductor Test System (STS)
Virtual instructor-led training includes digital course material that is delivered through the NI Learning Center.
NI virtual instructor-led training is delivered through Zoom, and Amazon AppStream/LogMein access is provided to participants to perform the exercises on virtual machines equipped with the latest software.
Set up and configure an STS to test a mixed-signal semiconductor device.
Communicate with a DUT.
Use STS tester resources to interactively create, modify, execute, and debug a test program using prewritten code modules.
Describe the test program architecture, modify it, and configure the execution flow.
Debug devices, signals, and test sequences with debug panels.
Collect test data and generate test reports.
Benchmark test time.
| Lesson | Overview | Topics |
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| Introduction to the STS | Explore the main concepts of the Semiconductor Test System (STS). |
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| Exploring the Test Head | Explore the high-level features and I/O for the STS test head. |
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| Exploring the Load Boards | Explore the high-level features of the Device Interface Board (DIB) and the different load board interface types. |
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| Docking and Interfacing with the STS | Describe the topology of a typical test cell and explore several options for docking an STS. |
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| Exploring the NI STS Software | Explore the software tools to monitor, maintain, debug, and calibrate the STS as well as the test development and code module development environment for STS. |
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| Navigating the Test Developer Workflow | Explore a sample test developer workflow and its key steps. |
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| Investigating STS Safety Requirements and Specifications | Explore and apply the Safety Requirements and Specifications, Safety Compliance, and Environmental Specifications of the STS system. |
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Exploring Tester Instrumentation | Explore the STS PXI Platform and common STS instrumentation. |
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| Exploring System Specifications | Explore the STS T1, T2, and T4 input and output specifications. |
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| Calibrating an STS | Explore the calibration modules and the types of calibration used in the STS system. |
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| Creating an STS Project | Create a test program and explore the sequence file and folder structure that are created for the test program. |
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| Exploring Pin Maps | Explore the purpose of the Pin Map and its role in mapping STS hardware to DUT pins. |
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| Reviewing a Tester Configuration and Load Board Schematic | Explore standard tester documentation, its content, and its purpose. |
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| Mapping Measurement Requirements | Map measurement requirements to ensure that the system and its equipped instruments can meet the measurement requirements in the Test Plan. |
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| Mapping DUT Pins to Instrument Channels | Use the Pin Map Editor to create and modify pin map files, which map DUT pins to instrument channels. |
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| Interfacing with the DUT using the Device Interface Board | Explore the different ways that you can connect your instruments to a Device Interface Board (DIB) and identify the resources available to assist with designing your own load board. |
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| Checking DUT Continuity | Use the digital pattern instrument to test the DUT for continuity prior to running other tests. |
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| Bringing Up the DUT | Use the Digital Pattern Editor to bring-up the Device Under Test (DUT) so that you can begin testing it. |
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| Measuring Leakage Current | Use the digital pattern instrument to measure leakage current for the DUT prior to running other tests. |
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| Preparing to Communicate with the DUT | Identify the file types associated with a digital project and describe the files that should be created prior to creating a digital pattern to communicate with the DUT. |
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| Creating Basic Digital Patterns to Communicate with the DUT | Create, edit, load, and burst basic digital patterns to communicate with the DUT using the Digital Pattern Editor. |
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| Converting Existing Digital Patterns | Convert patterns developed in other environments for use in the Digital Pattern Editor. |
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| Exploring the Test Sequence File | Explore the main components of a test sequence file and how to use each component. |
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| Adding Steps to a Test Sequence | Explore how to insert steps to a test sequence. |
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| Creating and Configuring Test Steps | In an STS project, create and configure test steps that call code modules. |
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| Using Test Step Templates | Explore the different step templates that are available and how to use them as part of a test sequence. |
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| Controlling TestStand Execution | Execute a test sequence and modify the test sequence to execute differently depending on the test conditions or settings. |
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| Setting Test Limits | Create, explore, and import test limits to quickly update your test sequences for different scenarios. |
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| Creating Test Configurations | Use the Test Program Editor and your test requirements to create test configurations for your system. |
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| Binning DUTs Based on Test Results | Explore the different ways that you can categorize DUTs based on the test results and implement a binning strategy. |
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| Configuring the Execution of a Test Program | Configure and run a test program in the test development environment. |
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| Generating Test Reports | Implement a result collection and test reporting strategy in NI TestStand. |
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| Debugging a Test Program | Use built-in TestStand features to identify and fix issues in a test sequence. |
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| Exploring Debugging Scenarios | Debug a test program in different unexpected situations. |
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| Benchmarking Test Time | Identify and address issues that limit code execution speed. |
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| Interacting with Tester Resources to Debug Issues | Use InstrumentStudio to interact with tester resources to debug test issues. |
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| Using the Digital Pattern Editor for Debugging | Use tools within the Digital Pattern Editor (DPE) to further debug test failures. |
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| Running a Sequence with the STS Operator Interface | Run a test program using the NI Semiconductor Test Operator Interface (OI) and get the true socket time. |
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