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Test Program Development with STS Course Overview

The Test Program Development with STS course delivers hands-on training for setting up and using a Semiconductor Test System (STS) to communicate with a device under test (DUT). The course will follow the typical semiconductor test workflow and milestones, which includes tight interaction with corresponding hardware. After completing this course, a test engineer will be able to use STS tester resources interactively to create, modify, execute, and debug test programs with pre-existing code modules (developed using LabVIEW or .NET/C#) to collect test data and test time reports.

 

Course Last Release Date or Version Number: On-Demand: 23.0

Course Details:

Test Program Development with STS Course Outline

LessonOverviewTopics
Introduction to the STSExplore the main concepts of the Semiconductor Test System (STS).  
  • Introduction to the STS Platform
Exploring the Test HeadExplore the high-level features and I/O for the STS test head. 
  • Overview of the STS Test Head  
  • Exploring the STS T1 M2 Inputs and Outputs
Exploring the Load BoardsExplore the high-level features of the Device Interface Board (DIB) and the different load board interface types.
  • Overview of Load Boards
  • Exploring Load Board Interface Types
  • Connecting a DIB to the STS
Docking and Interfacing with the STSDescribe the topology of a typical test cell and explore several options for docking an STS.
  • NI STS Standard Docking and Interfacing
  • Automated Docking Example
Exploring the NI STS SoftwareExplore the software tools to monitor, maintain, debug, and calibrate the STS as well as the test development and code module development environment for STS.
  • Overview of the STS Software
  • Introduction to the STS Maintenance Software
  • Introduction to the Test Development Environment
  • Introduction to the Operator Interface
Navigating the Test Developer WorkflowExplore a sample test developer workflow and its key steps.
  • Exploring a Sample Test Developer Workflow
Investigating STS Safety Requirements and SpecificationsExplore and apply the Safety Requirements and Specifications, Safety Compliance, and Environmental Specifications of the STS system.
  • Exploring the Safety Requirements of the STS
  • Ensuring the Safety Compliance for the STS
  • Exploring the Environmental Specifications for the STS

Exploring Tester Instrumentation

Explore the STS PXI Platform and common STS instrumentation.  
  • Exploring the NI PXI Platform
  • Identifying STS Instrumentation
  • Additional Common STS Instrumentation
  • Using Simulated Hardware
Exploring System SpecificationsExplore the STS T1, T2, and T4 input and output specifications.  
  • Exploring STS System Specifications
  • Exploring STS Specifications Online
Calibrating an STSExplore the calibration modules and the types of calibration used in the STS system.
  • What Is Calibration?
  • Navigating Types of STS Calibration
  • Exploring Calibration Modules Used in STS
  • Enabling Warm-Up Wait Time for STS
  • Checking DC Continuity/Functionality
Creating an STS Project  Create a test program and explore the sequence file and folder structure that are created for the test program.
  • Creating a Test Program
  • Exploring the Folder Structure
  • Exploring the Test Program Architecture
Exploring Pin MapsExplore the purpose of the Pin Map and its role in mapping STS hardware to DUT pins.
  • What Is a Pin Map?
  • Exploring Information in a Pin Map
  • Documentation Needed to Create a Pin Map
Reviewing a Tester Configuration and Load Board SchematicExplore standard tester documentation, its content, and its purpose.
  • Exploring the DUT Specifications
  • Tracking a Signal from the Instrument to the DUT
Mapping Measurement Requirements  Map measurement requirements to ensure that the system and its equipped instruments can meet the measurement requirements in the Test Plan.  
  • Mapping Measurement Requirements
  • Connecting Instrumentation to DUT Pins
  • Assigning Tester Resources Based on a Test Plan
Mapping DUT Pins to Instrument ChannelsUse the Pin Map Editor to create and modify pin map files, which map DUT pins to instrument channels.
  • Adding and Configuring an Instrument Using the Pin Map Editor
  • Reviewing Pin Map Errors and Warnings
  • Setting Up Multi-Instrument Sessions
Interfacing with the DUT using the Device Interface BoardExplore the different ways that you can connect your instruments to a Device Interface Board (DIB) and identify the resources available to assist with designing your own load board.
  • How Do I Connect My DIB to My Instruments?
  • How Do I Design My DIB?
  • Interfacing the DUT to the DIB
Checking DUT ContinuityUse the digital pattern instrument to test the DUT for continuity prior to running other tests.
  • What Is a Continuity Test?
  • What Instrument Do I Use to Check the Continuity of the DUT?
  • Performing a Continuity Test
Bringing Up the DUTUse the Digital Pattern Editor to bring-up the Device Under Test (DUT) so that you can begin testing it.
  • Determining How to Power Up the DUT
  • Powering Up the DUT
Measuring Leakage CurrentUse the digital pattern instrument to measure leakage current for the DUT prior to running other tests.
  • What Is the First Test to Run After Bring-Up?
  • Performing a Leakage Current Test
Preparing to Communicate with the DUTIdentify the file types associated with a digital project and describe the files that should be created prior to creating a digital pattern to communicate with the DUT.
  • Exploring the Contents of a Digital Project
  • Creating Specifications Sheets
  • Creating Levels Sheets
  • Creating Timing Sheets
Creating Basic Digital Patterns to Communicate with the DUTCreate, edit, load, and burst basic digital patterns to communicate with the DUT using the Digital Pattern Editor.
  • Exploring Vector-Based Patterns
  • Creating Digital Patterns
Converting Existing Digital PatternsConvert patterns developed in other environments for use in the Digital Pattern Editor.
  • Converting Existing Pattern Files
Exploring the Test Sequence FileExplore the main components of a test sequence file and how to use each component.
  • What Are the Components of a Sequence File?
  • Identifying Panes in the Sequence File Window
  • Exploring the Test Program Architecture
Adding Steps to a Test SequenceExplore how to insert steps to a test sequence.
  • Adding a Step to a Sequence
  • Exploring the Step Types
  • Configuring a Step
Creating and Configuring Test StepsIn an STS project, create and configure test steps that call code modules.
  • What Is a Code Module?
  • Choosing a Starting Point for Semiconductor Test Steps
  • Calling a TSM Test Step Template
  • Calling a Semiconductor Multi Test/Action Step
  • Configuring Test Step Settings
Using Test Step Templates  Explore the different step templates that are available and how to use them as part of a test sequence.
  • Creating a Test Sequence Using Step Templates
Controlling TestStand ExecutionExecute a test sequence and modify the test sequence to execute differently depending on the test conditions or settings.
  • Executing a Test Sequence
  • Managing and Sharing Data
  • Using Flow Control Steps to Change the Execution Flow
  • Using Expressions to Access or Modify Data
  • Changing Execution Based on a Test Failure
Setting Test LimitsCreate, explore, and import test limits to quickly update your test sequences for different scenarios.
  • Exporting Your Test Limits
  • Importing Your Test Limits
  • Adding Your Test Limits Files
Creating Test ConfigurationsUse the Test Program Editor and your test requirements to create test configurations for your system.
  • Creating Test Configurations
  • Defining Multiple Test Flows
Binning DUTs Based on Test ResultsExplore the different ways that you can categorize DUTs based on the test results and implement a binning strategy.
  • Overview of Binning
  • Setting the Bin Definitions File
  • Creating Hardware and Software Bins
Configuring the Execution of a Test ProgramConfigure and run a test program in the test development environment.
  • Configuring Station Settings
  • Configuring How TestStand Reports Test Results
  • Configuring Station Options
  • Configuring How TestStand Executes Your Code Modules
  • Executing Your Test Program
Generating Test ReportsImplement a result collection and test reporting strategy in NI TestStand.
  • Configuring Report Options
  • Selecting a Report Format
  • Generating an ATML Report
  • Configuring Test Result Collection
Debugging a Test ProgramUse built-in TestStand features to identify and fix issues in a test sequence.
  • Tracing Test Program Execution
  • Pausing and Stepping Through Execution
  • Handling Execution Errors
Exploring Debugging ScenariosDebug a test program in different unexpected situations.
  • Debugging Errors
  • Debugging Failed Tests
Benchmarking Test TimeIdentify and address issues that limit code execution speed.
  • Benchmarking Test Time
  • Optimizing TestStand Execution Speed
  • Optimizing Hardware Execution Speed
Interacting with Tester Resources to Debug Issues  Use InstrumentStudio to interact with tester resources to debug test issues.
  • Overview of InstrumentStudio
  • Debugging DC Power Instruments
  • Debugging Oscilloscopes
  • Debugging Driver Sessions
  • Debugging Multiple Instruments
  • Exporting Data for Additional Analysis
Using the Digital Pattern Editor for DebuggingUse tools within the Digital Pattern Editor (DPE) to further debug test failures.
  • Overview of Troubleshooting with the DPE
  • Viewing Pin Status in Real-Time
  • Debugging Pattern Execution
  • Debugging the Digital Scope
  • Analyzing Test Results Based on Parameter Sweeps
Running a Sequence with the STS Operator InterfaceRun a test program using the NI Semiconductor Test Operator Interface (OI) and get the true socket time.
  • Overview of the Operator Interface
  • Configuring and Running a Lot
  • Viewing Test Results and Reports

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