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The Device Testing with Digital Pattern Instruments Course helps you use PXI Digital Pattern Instruments and the Digital Pattern Editor to perform device tests, with a focus on device-under-test (DUT) communication, digital interface testing, and continuity and leakage testing. This course guides you through the complete test workflow, from calibration and debugging to extending tests into a test executive, as well as how to import a pattern into a test executive. You will learn how to create and edit all elements required to burst a digital pattern to your DUT, including pin maps, level sheets, timing sheets, and pattern files, Additionally, the course covers synchronization of digital pattern instrument with other instruments in your systems. At the end of this course, you will understand how to test DUT modes of operation with SPI commands and how to validate DUT communication, timing, and pin connections. The Device Testing with Digital Pattern Instruments Course is recommended for test engineers performing semiconductor device characterization and production tests.
Feature Highlights:
NI offers courses in a variety of languages to meet the needs of our global customers. For classroom and virtual course formats, review our Scheduled Virtual and Classroom Training Courses to see the language the instructor will use and the language that course materials, such as slides and manuals, will use. For on-demand options, visit our Learning Library to see the languages offered for each course.