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HOME SHOP Tools Network Wafer-Level Reliability Test Toolkit

Wafer-Level Reliability Test Toolkit

YEA Engineering, LLC

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The Wafer-Level Reliability Test Toolkit provides stress and measurement techniques for reliability estimation.

The Wafer-Level Reliability (WLR) Test Toolkit is a software add-on for LabVIEW. You can use this add-on with PXI Source Measure Units to perform semiconductor device reliability estimation at the extreme voltage and temperature ends of the device specifications. The add-on helps you use negative bias temperature instability and hot-carrier injection mechanisms to stress and measure the response of a device to monitor for signs of degradation. You can perform these tests on a wafer or a packaged level. The WLR Test Toolkit also provides visualizations for measurement and analysis data.

Part Number(s): 787133-35

Disclaimer: The Third-Party Add-Ons for LabVIEW on this page are offered by independent third-party providers who are solely responsible for these products. NI has no responsibility whatsoever for the performance, product descriptions, specifications, referenced content, or any and all claims or representations of these third-party providers. NI makes no warranty whatsoever, neither express nor implied, with respect to the goods, the referenced contents, or any and all claims or representations of the third-party providers.