PXIe-4309 Specifications

Definitions

Maximum and minimum specifications characterize the warranted performance of the instrument within the recommended calibration interval and under the stated operating conditions. These specifications are subject to production verification or guaranteed by design.

Typical specifications are specifications met by the majority of the instruments within the recommended calibration interval and under the stated operating conditions, based on measurements taken during production verification and/or engineering development. The performance of the instrument is not warranted.

Supplemental specifications describe the basic function and attributes of the instrument established by design and are not subject to production verification. They provide information that is relevant for the adequate use of the instrument that is not included in the previous definitions.

Measured specifications describe the measured performance of a representative model.

The following specifications are typical at 25 °C, unless otherwise noted.

  • Textcal is the device temperature at last external calibration.
  • Tselfcal is the device temperature at last self-calibration.

Input Characteristics

Note This product is specifically designed for the precise measurement of signals with low source impedance. For best performance and to minimize settling time, keep the source impedance ≤ 50 Ω from DC to 2 MHz.

Number of ADCs

8 simultaneously sampling ADCs

Number of channels

Single channel per ADC

8 differential analog input channels

Multichannel per ADC[1]1 Up to 4 channels per ADC.

32 differential analog input channels

ADC resolution

18 bits

Type of ADC

SAR

DNL

No missing codes

INL

Refer to Absolute Accuracy section

Measurement resolution[2]2 Depends on the sample rate. Refer to the Noise versus Sampling Rate section for more information.

18 bits - 28 bits

Maximum warranted sample rate[3]3 For multichannel, up to 4 channels per ADC. Refer to the PXIe-4309 User Manual for Maximum Sample Rates in Hardware-Timed Single point, On-Demand, and External Sample Clock modes.
Auto zero none

Single channel per ADC

2 MS/s

Multichannel per ADC, High Accuracy

10 kS/s (aggregate)

Multichannel per ADC, Maximum Warranted Throughput

400 kS/s (aggregate)

Auto zero once

Single channel per ADC

2 MS/s

Multichannel per ADC, High Accuracy

10 kS/s (aggregate)

Multichannel per ADC, Maximum Warranted Throughput

400 kS/s (aggregate)

Auto zero every sample

Single channel per ADC

10 kS/s

Multichannel per ADC

10 kS/s (aggregate)

Note Aggregate sample rate is the total number of samples acquired by a single ADC per second. For example, when a single ADC is sampling two channels every 10 us, each channel is sampled at 100kS/s and the aggregate sample rate for that ADC is 200kS/s.
Chopping

Single channel per ADC

10 kS/s

Multichannel per ADC

10 kS/s (aggregate)

Input coupling

DC

Input range

±0.1 V, ±1.0 V, ±10 V, ±15 V

Input overrange

0.5% of range

Maximum warranted working voltage (signal + common mode)

Maximum warranted difference of 15.5 V of the inputs per ADC

Note On each ADC bank of 4 analog input channels, the maximum warranted voltage difference across the four positive and the four negative inputs can be no more than 15.5 V. For example, if there is +15 V (signal + common mode) on one channel while applying -15 V (signal + common mode) on another channel within an ADC bank, the signal cannot be measured properly due to the 30 V difference, which exceeds the specified limit of 15.5 V. To make both measurements, the -15 V must be measured on a channel from a separate ADC bank.
Overvoltage protection

Device on/off

±30 V min

Overvoltage protection input current

Device on

±100 µA

Device off

±10 µA

Absolute Accuracy

DC Voltage Specifications

Table 1. DC Voltage Specifications for Auto Zero None, Auto Zero Once, Auto Zero Every Sample, and Chopping
Mode Range Maximum Absolute Accuracy *, **, †† Temperature Coefficient††
24 Hour†, ‡ Textcal ± 1 °C Tselfcal ± 1 °C 2 Year Textcal ± 5 °C Tselfcal ± 1 °C 2 Year Textcal ± 10 °C Tselfcal ± 5 °C 0 °C - 55 °C
± (ppm of reading + μV) ± (ppm of reading + μV) / °C
Auto Zero None 0.1 V 33 + 3.2 60 + 7.6 165 + 11.6 25 + 1
1.0 V 28 + 7.4 55 + 16.2 140 + 36.2 20 + 5
10 V 23 + 59.6 50 + 155 115 + 355 15 + 50
15 V 28 + 89.0 55 + 307 140 + 607 20 + 75
Auto Zero Once 0.1 V 33 + 2.3 60 + 6.7 165 + 7.1 25 + 0.1
1.0 V 28 + 2.5 55 + 11.3 140 + 11.7 20 + 0.1
10 V 23 + 9.7 50 + 104.9 115 + 105.3 15 + 0.1
15 V 28 + 14.1 55 + 232.1 140 + 232.5 20 + 0.1
Auto Zero Every Sample 0.1 V 33 + 0.3 60 + 4.7 165 + 5.1 25 + 0.1
1.0 V 28 + 0.5 55 + 9.3 140 + 9.7 20 + 0.1
10 V 23 + 2.7 50 + 55.4 115 + 55.8 15 + 0.1
15 V 28 + 4.0 55 + 156.1 140 + 156.5 20 + 0.1
Chopping 0.1 V 33 + 0.1 60 + 2.6 165 + 2.6 25 + 0.01
1.0 V 28 + 0.2 55 + 7.1 140 + 7.2 20 + 0.01
10 V 23 + 1.3 50 + 52.7 115 + 52.7 15 + 0.01
15 V 28 + 2.0 55 + 153.0 140 + 153.1 20 + 0.01

*Source Impedance ≤ 50 Ω.

Relative to External Calibration Source.

Assumes Offset Nulling.

**Table 1 applies to multichannel per ADC Sample Rate ≤10 S/s and single channel per ADC Sample Rates ≤ 100kS/s. For Sample rates > 100 kS/s with single channel per ADC, operate in an integer division of 2 M S/s to maintain Table 1 accuracy.

For Sample Rate >10 S/s with multichannel per ADC, refer to the additional error from Accuracy vs Number of Channels per ADC vs Sample Rate section.

††Temperature Coefficient is an adder to the Absolute Accuracy values that does not apply unless operating outside of the stated self-calibration temperature intervals. Temperature Coefficient is included in the Absolute Accuracy values over the stated self-calibration temperature intervals.

DC Voltage Noise Specifications

Table 2. DC Voltage Noise Specifications for Auto Zero None, Auto Zero Once, Auto Zero Every Sample, and Chopping
Mode Range Noise*,†
10 S/s 10 kS/s 2 MS/s
μVpk-pk μVrms
Auto Zero None 0.1 V 2.2 0.6 6.9
1.0 V 2.4 0.8 11
10 V 9.6 5.8 84
15 V 14 8.7 125
Auto Zero Once 0.1 V 2.2 0.6 6.9
1.0 V 2.4 0.8 11
10 V 9.6 5.8 84
15 V 14 8.7 125
Auto Zero Every Sample 0.1 V 0.2 0.8 N/A
1.0 V 0.4 1.1
10 V 2.6 7.4
15 V 3.9 11
Chopping 0.1 V 0.1 0.5
1.0 V 0.2 0.8
10 V 1.3 6.2
15 V 2 9.2

*Source Impedance ≤50 Ω

Noise for Single Channel per ADC. For Multiple Channel per ADC, refer to the Noise versus Sampling Rate section and the Accuracy vs Number of Channels per ADC vs Sample Rate section.

Accuracy vs Number of Channels Per ADC vs Sample Rate

Note The behavior demonstrated in the Accuracy vs Number of Channels per ADC vs Sample Rate graphs only represent data sets in which all the channels on a single ADC bank are at the same input range.

The graphs in this section illustrate the additional sources of error when scanning multiple channels per ADC at sample rates above 10 S/s. There are four sources of additional error that you need to add together: Gain Error, Offset Error, Differential Ghosting Error, and Common Mode Ghosting Error. Each of these errors depends on the sample rate and the number of channels being scanned per ADC.

For figures that depict a differential ghosting error, a change in the differential voltage between a channel and a preceding channel that scans the list of a single ADC causes differential ghosting error on a channel.

For example, consider three channels being scanned at 5 kS/s on a single ADC (channel 0, channel 16, and channel 24) with differential signals of 12 V, 10 V, and 6 V respectively. The change in differential signal for each channel is:
  • 2 V (12 V-10 V) for channel 16.
  • 4 V (10 V - 6 V) for channel 24.
  • 6 V (6 V - 12 V) for channel 0, because channel 24 is before channel 0.
At 5kS/s, the graph shows an error of 5uV/V. So, due to differential ghosting, the additional error for each channel is:
  • 10 uV (2 V * 5 uV/V) for channel 16.
  • 20 uV on channel 24.
  • 30 uV for channel 0.

Common mode ghosting follows the same methodology as differential ghosting, but the error is a function of the common mode voltage of the channels being scanned.

Auto Zero None and Auto Zero Once

The following graphs show the typical accuracy error difference between 1 channel per bank and multiple channels per bank.

Figure 1. Additional Gain Error for Multichannel per ADC over Sample Rate Per Channel >10 S/s

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Figure 2. Additional Offset Error for Multichannel Per ADC over Sample Rate Per Channel >10 S/s

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Figure 3. Differential Ghosting Error for Multichannel Per ADC over Sample Rate Per Channel

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Figure 4. Common Mode Ghosting Error for Multichannel Per ADC over vs Sample Rate Per Channel

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Auto Zero Every Sample

Figure 5. Additional Gain Error for Multichannel Per ADC over Sample Rate Per Channel >10 S/s

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Figure 6. Additional Offset error for Multichannel per ADC over Sample Rate per Channel >10 S/s

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Figure 7. Differential Ghosting Error for Multichannel Per ADC over Sample Rate Per Channel

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Figure 8. Common Mode Ghosting Error for Multichannel Per ADC over vs Sample Rate Per Channel

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Noise versus Sampling Rate

Auto Zero None and Auto Zero Once

Figure 9. Noise versus Sample Rate Per Channel (Single channel per ADC), Measured
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Figure 10. Noise versus Sample Rate Per Channel (Multichannel per ADC), Measured

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Auto Zero Every Sample

Figure 11. Noise versus Sample Rate Per Channel (Single Channel Per ADC)
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Figure 12. Noise versus Sample Rate Per Channel (Multichannel Per ADC)
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Chopping

Figure 13. Noise versus Sample Rate Per Channel (Single Channel Per ADC)
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Figure 14. Noise versus Sample Rate Per Channel (Multichannel Per ADC)
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Digital Filter Frequency Response

Note Applies to sampling rates ≤ 1 MS/s for all configurations that use a single channel per ADC.
Note Applies to sampling rates ≤ 90 kS/s (aggregate) for all configurations that use multiple channels per ADC.
Note Does not apply to Hardware-Timed Single Point, On-Demand, and External Sample Clock modes.
Figure 15. Digital Filter Frequency Response

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Dynamic Characteristics

Spectral Noise Density

Input voltage noise density at 1 kHz.

0.1 V

6.2nV/Hz

1.0 V

12nV/Hz

10 V

94nV/Hz

15 V

136nV/Hz

Input current noise density at 1 k Hz

0.5pA/Hz

Auto Zero None and Auto Zero Once

Figure 16. 2 MS/s Spectral Noise Density (Single channel per ADC)
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Figure 17. 20 kS/s Spectral Noise Density (Single channel per ADC)
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Figure 18. 20 kS/s Spectral Noise Density (Multichannel per ADC)
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Figure 19. 2 kS/s Spectral Noise Density (Single channel per ADC)
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Figure 20. 2 kS/s Spectral Noise Density (Multichannel per ADC)
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Auto Zero Every Sample

Figure 21. 2 kS/s Spectral Noise Density (Single channel per ADC)
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Figure 22. 2 kS/s Spectral Noise Density (Multichannel per ADC)
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Chopping

Figure 23. 2 kS/s Spectral Noise Density (Single channel per ADC)
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Figure 24. 2 kS/s Spectral Noise Density (Multichannel per ADC)
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Common-Mode Rejection Ratio (CMRR)

DC

> 160 dBc

DC - 100 Hz

0.1 V, 1.0 V

> 126 dBc

10 V

> 120 dBc

15 V

> 114 dBc

Figure 25. Common-Mode Rejection Ratio
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Crosstalk, Input Channel Separation

Note To maintain crosstalk performance use separation and/or shielding between signal cables.
TB-4309 (ST)4 Inputs shorted at terminal block screw terminals. and TB-4309 (MT)5 Inputs shorted at SCB-68 screw terminals using 2 m, 68-pin cable.

1 kHz

Typically ≤ -120 dBc

10 kHz

Typically ≤ -100 dBc

100 kHz

Typically ≤ -80 dBc

500 kHz

Typically ≤ -70 dBc

Bandwidth

-3.0 dB bandwidth

500 kHz

Figure 26. Magnitude Response
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Flatness

DC - 20 kHz

-6.5 mdB

DC - 80 kHz

-100 mdB

Onboard Calibration Reference

Voltage

Output voltage range

6.741 V – 7.298 V

Output current drive

±1 μA

Temperature coefficient

±1 ppm/°C

Overvoltage protection

±30 V min

Frequency Timebase Characteristics

Resolution

10 ns

Accuracy

Using internal timebase

±50 ppm

Using external timebase

Equal to accuracy of external timebase

Timing and Synchronization

Number of timing engines

1

Reference clock source

Onboard clock, backplane PXIe_CLK100

Digital Triggers

Purpose

Start trigger, reference trigger, pause trigger

Source

PFI 0, PFI 1, PXI_Trig <0..7>, PXI_Star,
PXIe_DStar A, PXIe_DStar B

Polarity

Software-selectable

Debounce filter settings

Disable, 90 ns, 5.12 µs, custom interval

Output Timing Signals

Source

Start trigger, reference trigger, pause trigger, sample clock

Destination

PFI 0, PFI 1, PXI_Trig <0..7>, PXIe_DStarC

PFI 0 and PFI 1 (Front Panel Digital Triggers)

Input

Logic compatibility

3.3 V or 5 V

High, VIH

2.40 V minimum

Low, VIL

0.95 V maximum

Input impedance

10 kΩ

Input current (0 V ≤ Vin ≤ 5 V)

≤ 500 μA

Overvoltage protection

±30 V minimum

Output

High, VOH

3.43 V maximum

Sourcing 5 mA

2.88 V minimum

Low, VOL

Sinking 5 mA

0.33 V maximum

Output impedance

50 Ω

Output current

±30 mA minimum

Overvoltage protection

±30 V minimum

General Specifications

Bus Interface

Form factor

x1 PXI Express peripheral module, specification rev 1.0 compliant

Slot compatibility

PXI Express or PXI Express hybrid slots

DMA channels

1, analog input

FIFO buffer size

1,023 samples

Data transfers

Direct memory access (DMA), programmed I/O

Power Requirements

+12 V

2 A maximum

+3.3 V

1 A maximum

Physical

Dimensions

16 cm × 10 cm (6.3 in. × 3.9 in.) 3U CompactPCI slot

Weight

238 g (8.4 oz)

I/O connector

96-pin male DIN 41612/IEC 60603-2 connector

Measurement Category[6]6 Measurement Categories CAT I and CAT O are equivalent. These test and measurement circuits are not intended for direct connections to the MAINS building installations of Measurement Categories CAT II, CAT III, CAT IV.

I

Caution Do not use the PXIe-4309 for connections to signals or for measurements within Categories II, III, or IV.
Caution The protection provided by the PXIe-4309 can be impaired if it is used in a manner not described in this document.
Caution Clean the hardware with a soft, nonmetallic brush. Make sure that the hardware is completely dry and free from contaminants before returning it to service.

Environmental Specifications

Operating Environment

Ambient temperature range

0 °C to 55 °C (Tested in accordance with IEC 60068-2-1 and IEC 60068-2-2. Meets MIL-PRF-28800F Class 3 low temperature limit and MIL-PRF-28800F Class 2 high temperature limit.)

Relative humidity range

10% to 90%, noncondensing (Tested in accordance with IEC 60068-2-56.)

Maximum altitude

2,000 m (800 mbar)

Pollution Degree

2

Indoor use only.

Storage Environment

Ambient temperature range

-40 °C to 71 °C (Tested in accordance with IEC 60068-2-1 and IEC 60068-2-2. Meets MIL-PRF-28800F Class 3 limits.)

Relative humidity range

5% to 95%, noncondensing (Tested in accordance with IEC 60068-2-56.)

Shock and Vibration

Operating shock

30 g peak, half-sine, 11 ms pulse (Tested in accordance with IEC 60068-2-27. Meets MIL-PRF-28800F Class 2 limits.)

Random vibration

Operating

5 Hz to 500 Hz, 0.3 grms

Non-operating

5 Hz to 500 Hz, 2.4 grms (Tested in accordance with IEC 60068-2-64. Non-operating test profile exceeds the requirements of MIL-PRF-28800F, Class 3.)

Calibration

You can obtain the calibration certificate and information about calibration services for the PXIe-4309 at ni.com/calibration.

Self-calibration

On software command, the module computes gain, offset, and linearity corrections relative to the high-precision internal voltage reference.

Self-calibration interval

Depending on required absolute accuracy, self-calibration is recommended whenever the current device temperature differs by more than the specified temperature range from the device temperature at which the last self-calibration was performed.

Calibration interval

2 years

Warm-up time

15 minutes

Online Product Certification

Refer to the product Declaration of Conformity (DoC) for additional regulatory compliance information. To obtain product certifications and the DoC for this product, visit ni.com/certification, search by model number or product line, and click the appropriate link in the Certification column.

Environmental Management

NI is committed to designing and manufacturing products in an environmentally responsible manner. NI recognizes that eliminating certain hazardous substances from our products is beneficial to the environment and to NI customers.

For additional environmental information, refer to the Minimize Our Environmental Impact web page at ni.com/environment. This page contains the environmental regulations and directives with which NI complies, as well as other environmental information not included in this document.

Waste Electrical and Electronic Equipment (WEEE)

1378 At the end of the product life cycle, all products must be sent to a WEEE recycling center. For more information about WEEE recycling centers, National Instruments WEEE initiatives, and compliance with WEEE Directive 2002/96/EC on Waste and Electronic Equipment, visit ni.com/environment/weee.

电子信息产品污染控制管理办法(中国RoHS)

  • 1378 中国RoHSNI符合中国电子信息产品中限制使用某些有害物质指令(RoHS)。关于NI中国RoHS合规性信息,请登录 ni.com/environment/rohs_china。(For information about China RoHS compliance, go to ni.com/environment/rohs_china.)
  • 1 Up to 4 channels per ADC.

    2 Depends on the sample rate. Refer to the Noise versus Sampling Rate section for more information.

    3 For multichannel, up to 4 channels per ADC. Refer to the PXIe-4309 User Manual for Maximum Sample Rates in Hardware-Timed Single point, On-Demand, and External Sample Clock modes.

    4 Inputs shorted at terminal block screw terminals.

    5 Inputs shorted at SCB-68 screw terminals using 2 m, 68-pin cable.

    6 Measurement Categories CAT I and CAT O are equivalent. These test and measurement circuits are not intended for direct connections to the MAINS building installations of Measurement Categories CAT II, CAT III, CAT IV.