Configure Semiconductor Steps to Use Only Needed Pins

Typically, you use the TestStand Batch process model to perform multisite testing in parallel. However, when you connect a DUT pin to an instrument shared by multiple sites, and the instrument does not permit independent operations on its channels, the Semiconductor Multi Test or Semiconductor Action step executes in one test socket to test multiple sites. In this situation, the step determines if it can execute tests in parallel by checking that the pins the test code module uses are connected to instruments that are not shared across multiple sites.

By default, the Semiconductor Multi Test and Semiconductor Action steps assume a code module uses every DUT pin. To improve performance, specify the DUT pins that the test code module uses.

  1. In the sequence editor, click the step you want to edit.
  2. Click on the Options tab in the Step Settings pane.
  3. Select Specify Manually in the Specify Pins and Relays drop-down menu.
  4. To specify the DUT pins, enable the Specify DUT Pins option.
  5. Enable the DUT pins and pin groups the step uses.
  6. Review the Multisite Execution Diagram to determine how many threads TSM uses to execute the step.

If the test uses any system pins, enable the Include System Pins option. When you enable the Include System Pins option, the step executes in one thread for all sites.

Note Specifying DUT and system pins on steps in the ProcessSetup and ProcessCleanup sequences has no effect. Steps in those sequences execute as if you selected One thread only in the Multisite Option drop-down menu and included all DUT and system pins in the SemiconductorModuleContext object.