TestStand Sequence Call and Semiconductor Sequence Call steps allow you to simplify editing and maintaining test programs by placing common test steps into sequences. However, these Sequence Call steps incur a performance penalty that affects the overall test time. You can eliminate this performance penalty at the expense of a more complex test program by using inline expansion. Inline expansion is the process of replacing Sequence Call steps with the contents of the sequences they call.

Follow these steps to use inline expansion with a TestStand or Semiconductor Sequence Call step in the MainSequence sequence:

1. Replace the Sequence Call step in the MainSequence sequence with the contents of the sequence that the Sequence Call step calls.
2. Rename the steps you inserted in the MainSequence sequence, if necessary, to avoid duplicate step names.
3. For each parameter in the called sequence, replace all references to the parameter in the step expressions of the steps you copied with the value that the Sequence Call step used for the parameter. For example, replace the expression Parameters.Frequency with 3000 if the Sequence Call step passes 3000 for the Frequency parameter.
4. Copy local variables from the called sequence into the MainSequence sequence.
5. Rename the local variables you copied, if necessary, to avoid duplicate variable names. Update references to the local variables with the new names.
6. Complete the following actions for each Semiconductor Action and Semiconductor Multi Test step you copied to the MainSequence sequence:
   1. Click on the Options tab for the step.
   2. Check if the step uses an expression to specify the pins.
   3. If the step uses an expression to specify the pins, choose Select Manually from the Specify Pins and Relays drop-down menu and specify the pins explicitly using the check boxes.
7. Complete the following actions for each Semiconductor Multi Test step you copied to the MainSequence sequence:
   1. Click on the Tests tab for the Semiconductor Multi Test step.
   2. Identify tests that require additional configuration and note their published data IDs.
   3. Click on the Tests tab of the Semiconductor Sequence Call step.
   4. Find the tests with the same published data IDs you noted in step 7b.
   5. Copy the tests from the Semiconductor Sequence Call to the Semiconductor Multi Test step.