TSM Step Types
- Updated2025-01-22
- 2 minute(s) read
TSM Step Types
The TSM folder in the Step Types list on the Insertion Palette pane in the TestStand Sequence Editor contains the following step types:
- Semiconductor Multi Test—Evaluates one or more parametric or functional tests for the DUT. A single Semiconductor Multi Test step can specify multiple parametric or functional tests. You can configure multisite and binning options directly on the step.
- Semiconductor Action—Performs an action, such as instrument configuration, with access to the pin map and per-site inputs. You can configure multisite and per-site input options directly on the step.
- Semiconductor Sequence Call Step—Calls a sequence and propagates tests to Semiconductor Multi Test steps in the called sequence.
- Set Relays—Controls relays and applies relay configurations.
- Get Test Information—Obtains the values for lot settings, station settings, STS state, execution data, and custom test conditions.
- Control STS Test Head Step—Controls properties of the STS.
- Inline QA Test Block—Inserts a block of Inline QA Test Block and End steps, in which you can insert additional steps that call code modules that perform the inline QA tests.
- Set and Lock Bin—Uses an expression to assign a software bin to a DUT and overrides TSM automatic bin assignment.
- Load Correlation Offsets Step—Loads and applies correlation offset values to test results on a per-site basis at run time before evaluating the test result data against limits.
- Perform Part Average Testing Step—Performs part average testing for any tests with part average testing enabled that have already been performed for the current part.
Note TSM steps disable the
Switching panel of the Properties tab
in the Step Settings pane. Use relays in the pin map to perform
switching operations. To use the NI Switch Executive to perform switching
operations, use the NI Switch Executive API in code modules.
Tip
RF Steps is a series of
TSM step types for you to create measurement sequences for RF instruments. For more
information, refer to the RF Steps. You must have the STS
Software installed to use RF Steps and to view the RF Steps
documentation.
Tip The Semiconductor Test
Library provides a series of TSM step types for you to perform common
operations, such as setting up and closing instruments, powering up a DUT, or
executing common tests. For more information, refer to Semiconductor Test
Library. You must have the STS Software installed to use
Semiconductor Test Library and view the Semiconductor Test Library
documentation.
Related Information
- Semiconductor Multi Test Step
- Testing Multiple Sites in Parallel (TSM)
- Binning DUTs Based on Test Results (TSM)
- Semiconductor Action Step
- Semiconductor Action Per-Site Inputs Tab
- Semiconductor Sequence Call Step
- Inline QA Test Block Step (TSM)
- Flow Control Step Types
- Performing Inline Quality Assurance Testing (TSM)
- Set and Lock Bin Step (TSM)
- Set Relays Step (TSM)
- Get Test Information Step (TSM)
- Control STS Test Head Step (TSM)
- Load Correlation Offsets Step (TSM)
- Perform Part Average Testing Step (TSM)
- Part Average Testing (TSM)
- RF Steps
- Semiconductor Test Library
- Relays (TSM)
- Switching (TSM)
This example demonstrates a test program that uses four sites and three shared instruments, as shown in the following figure. The test program shares the DMM1 instrument across all four sites and shares the DMM2 and DMM3 instruments across two sites each. All three instruments contain only one channel routed to each site using a switch (MUX).
- Configuring Switches with Switch Executive (TSM)