Enable and configure the TSM result processing plug-ins to launch the STDF Log Options dialog box, in which you can specify settings for the STDF Log file.

The STDF Log Options dialog box contains the following options:

• STDF Log Destination Directory—Absolute path of the directory in which you want TSM to create the data log file. Leave the control blank if you want TSM to create the data log file in the same directory as the test program main sequence file. During testing, the STDF Log result processor writes data to a temporary file with an extension of .stdtemp in this directory at the end of each batch. When the file completes, the STDF Log result processor renames the file to the final report filename you specify.
• Generate One File per Wafer—Specifies to create a separate STDF log file for each tested wafer. This option has no effect when testing without a wafer probe.
• Limit Number of Test Data Records—Specifies to limit the number of individual part test records in the STDF log to one of out every N DUTs you specify per site. Individual test records include PTR, FTR, and DTR. The summary test result records include the test result records of the parts for which you omitted individual test records. When you enable the Generate One File per Wafer option, this option applies to each STDF file independently and not to the entire lot. Each wafer STDF file includes test records for one out of every N DUTs per site.