Use the following constants with the Semiconductor Multi Test step properties to configure options for the step:

• EvaluationType—Use the following constants with the Step.Result.Evaluations[i].EvaluationType property:
  • 0—Numeric Limit test
  • 1—Pass/Fail test
  • 2—None evaluation
• ComparisonType—Use the following constants with the Step.Result.Evaluations[i].NumericLimit.ComparisonType property:
  • "GELE"—Low <= X <= High
  • "GTLT"—Low < X < High
  • "GELT"—Low <= X < High
  • "GTLE"—Low < X <= High
  • "LOG"—No comparison
• SynchronizationOption—Use the following constants with the Step.Multisite.SynchronizationOption property:
  • 0—One thread per site
  • 1—One thread only
  • 2—One thread per subsystem
• SpecifyPinsAndRelaysOption—Use the following constants with the Step.Multisite.SpecifyPinsAndRelaysOption property:
  • 0—Specify manually
  • 1—Use expression
• DUTPinFilterOption—Use the following constants with the Step.Multisite.DUTPinFilterOption property:
  • 0—Include all DUT pins except those listed in the ExcludedDUTPins array.
  • 1—Exclude all DUT pins except those listed in the IncludedDUTPins array.
• SpecifySiteRelays—Use the following constants with the Step.Multisite.SpecifySiteRelays property:
  • False—Include all site relays.
  • True—Include only the site relays listed in the IncludedSiteRelays array.
• TestFailureOption—Use the following constants with the Step.EvaluationFailureOption property:
  • 0—Stop on failure. The step stops performing tests after the first test fails.
  • 1—Continue on failure. The step performs all tests even if one test fails.