Use the Semiconductor Multi Test step edit tabs in the TestStand Sequence Editor to specify the tests, limits, multisite, and binning options for the Semiconductor Multi Test step.

The Step Settings pane for the Semiconductor Multi Test step contains the following tabs:

• Tests—Configure the tests for the step. Each test specifies the test number, test name, pin or pin group, published data ID, limits, scaling factor, base units, software bin, evaluation type, test data source, and measurement destination.
• Per-Site Inputs—Configure the per-site inputs for the step. Each per-site input specifies a data value that you access in a code module using the TSM Code Module API.
• Options—Configure multisite and other options for the step.
• Part Average Testing—Configure part average testing (PAT) on the tests for the step.