The Semiconductor Multi Test step uses the following process when executing:

1. Creates a SemiconductorModuleContext object and stores it on the Step.SemiconductorModuleContext property if the site that executes the step is the working site. The SemiconductorModuleContext object describes a subset of pins, relays, sites, and instruments on a test system.
2. Replaces each test that specifies a pin group with a set of tests that are equivalent to the pin group test and deletes the pin group test, except for the following differences:
   • The Pin is set to the name of the pin in the pin group.
   • The Test Number is computed by adding the test number specified for the pin group test to the zero-based index of the pin in the pin group.
   • The Test Name is computed by appending the name of the pin in the pin group to the test name specified for the pin group test.
   Note This replacement happens the first time the step executes.
3. Calls a code module that completes the following actions:
   1. Receives the Step.SemiconductorModuleContext property as an input parameter.
   2. Obtains instrument channel and session information using the TSM Code Module API.
   3. Performs measurements.
   4. Publishes measurement data using the TSM Code Module API.
4. Performs tests. For each test, the step completes the following actions:
   1. Obtains the measurement value from the published measurement data or from the expression, if specified, in the Test Data Source column on the Tests tab.
   2. Adds the correlation offset specified in the currently loaded correlation offsets file, if any, to the measurement value.
   3. Compares the measurement value against the specified limits.
   4. Sets the test status depending on the evaluation type, limits, or measurement value, as shown in the following table.

      Evaluation Type	Condition	Status
      Numeric Limit	You specify a low limit and high limit	Passed or Failed
      	You do not specify a low limit and high limit	Done
      Pass/Fail	The measurement value is True	Passed
      	The measurement value is False	Failed
      None	None	Done

      Note When you enable the Stop Performing Tests after First Failure option on the Options tab and a test fails, TSM sets the status of the remaining Numeric Limit and Pass/Fail tests to Skipped. The step sets the status for tests with the None evaluation type to Done regardless of whether any test fails.
   5. Stores the measurement value in the expression, if specified, in the Export Data To column on the Tests tab.
   6. Assigns a software bin to the DUT if the test fails and a bin has not yet been assigned to the DUT. If you have already assigned a bin using the Set and Lock Bin step and the test fails, the step reports a run-time error.
   7. Continues or stops performing tests depending on whether a test failed and whether you enable the Stop Performing Tests after First Failure option on the Options tab. The step stores the measurement value in the Export Data To expression for tests with the None evaluation type, regardless of whether a test failed.
5. Sets the step status to Passed if all tests pass. Otherwise, sets the step status to Failed or Error.