Enable and configure the TSM result processing plug-ins to launch the CSV Test Results Log Options dialog box, in which you can specify settings for the CSV Test Results Log.

The CSV Test Results Log Options dialog box contains the following options:

• CSV Log Destination Directory—Absolute path of the directory in which you want TSM to create the CSV data log file. Leave the control blank if you want TSM to create the CSV data log file in the same directory as the test program main sequence file. During testing, the CSV Test Results Log result processor writes data to a temporary file with an extension of .csvtemp in this directory at the end of each batch. When the file completes, the CSV Test Results Log result processor renames the file to the final report filename you specify.
• Generate One File per Wafer—Specifies to create a separate CSV log file for each tested wafer. This option has no effect when testing without a wafer probe. Each new log file resets the batch number to 1.
• Log Wafer Data—Specifies to create columns in the CSV log file for the following data:
  • Wafer ID
  • Die X Coordinate
  • Die Y Coordinate
• Log Code Module Execution Time—Specifies to create a column in the CSV log file for the code module execution time for each test.
• Limit Number of Test Data Records—Specifies to limit the number of individual part test records in the CSV log file to one of out every N DUTs you specify per site. When you enable the Generate One File per Wafer option, this option applies to each CSV file independently and not to the entire lot. Each wafer CSV file includes test records for one out of every N DUTs per site.