From Saturday, Nov 23rd 7:00 PM CST - Sunday, Nov 24th 7:45 AM CST, ni.com will undergo system upgrades that may result in temporary service interruption.
We appreciate your patience as we improve our online experience.
From Saturday, Nov 23rd 7:00 PM CST - Sunday, Nov 24th 7:45 AM CST, ni.com will undergo system upgrades that may result in temporary service interruption.
We appreciate your patience as we improve our online experience.
A combination of low phase noise and noise floor, excellent dynamic range, and high second- and third-order intercepts makes an NI VSA well suited for a broad range of applications including adjacent channel leakage ratio (ACLR) measurements and spurs and harmonics measurements.
With up to 765 MHz of instantaneous RF bandwidth, an NI VSA offers the ability to measure extremely wide bandwidths in a single acquisition. This is useful for many applications including testing wireless standards, such as LTE-A Pro, and digital predistoriton and radar pulse measurements.
NI-RFmx provides a highly optimized and intuitive API that offers both ease of use and advanced measurement configuration. With NI-RFmx, an NI VSA can perform tasks such as measurements on digital and analog modulated signals and RF spectral measurements including channel power, adjacent channel power, and harmonics.
When performing spectral analysis on a high-frequency signal, the application determines whether you should use the Fast Fourier Transform (FFT) analyzer or a swept spectrum analyzer.
Using NI PXI Vector Signal Analyzers, along with the NI LabVIEW FPGA Module, Captronic Systems created a customized, scalable solution to test the entire range of radar function.
The PXIe-5668 microwave signal analyzer meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit (RFIC) characterization, Radio Detection And Ranging (RADAR) test, and spectrum monitoring/signal intelligence.
Application Note
Noise Figure Measurement With the NI PXI VSA
Learn about the fundamentals of noise and noise figure measurements, including the Y-factor technique and methods to calculate measurement uncertainty with an NI VSA and LabVIEW.
Explore a wide range of support content, including examples and troubleshooting information.