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Perform S-Parameter Measurements
With frequency coverage up to 26.5 GHz, NI VNAs have a simplified calibration process through NI InstrumentStudio™ software for quick and accurate 2-port S-parameter measurements and the characterization of RF components.
Featured Content
The Benefits and Applications of the New 26.5 GHz Vector Network Analyzer
In this webinar, learn how the NI PXIe-5633 can be used to conduct modulated and S-parameter measurements when paired with the NI PXIe-5842 VST.
RF Front End Testing with NI PXI
Reduce bench space, increase time to market, and maintain the accuracy of traditional benchtop instruments by utilizing the PXI platform to conduct RF front-end testing.
A New Approach for IC Test
Amid evolving device complexity, shorter cycles, and meeting market demands, the modular PXI platform aids engineers exceed requirements through efficient test automation.
Application Resource
Fundamentals of Building a Test System
Defining a test strategy and planning system investments are critical to reducing cost, optimizing your test-investment life cycle, and maximizing efficiency. Learn test strategies, best practices, and design tradeoffs for your test systems.
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