With frequency coverage up to 26.5 GHz, NI VNAs have a simplified calibration process through NI InstrumentStudio™ software for quick and accurate 2-port S-parameter measurements and the characterization of RF components.
In this webinar, learn how the NI PXIe-5633 can be used to conduct modulated and S-parameter measurements when paired with the NI PXIe-5842 VST.
Reduce bench space, increase time to market, and maintain the accuracy of traditional benchtop instruments by utilizing the PXI platform to conduct RF front-end testing.
Amid evolving device complexity, shorter cycles, and meeting market demands, the modular PXI platform aids engineers exceed requirements through efficient test automation.
Application Resource
Fundamentals of Building a Test System
Defining a test strategy and planning system investments are critical to reducing cost, optimizing your test-investment life cycle, and maximizing efficiency. Learn test strategies, best practices, and design tradeoffs for your test systems.
Explore a wide range of support content, including examples and troubleshooting information.